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Dive into the research topics where Eric Bergeault is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Nonlinear uncertainty propagation of on-wafer mixed-mode S parameter measurements using Multimode-TRL calibration
Pham, T. D., Allal, D., Ziade, F. & Bergeault, E., 1 Aug 2020, 2020 Conference on Precision Electromagnetic Measurements, CPEM 2020. Institute of Electrical and Electronics Engineers Inc., 9191841. (CPEM Digest (Conference on Precision Electromagnetic Measurements); vol. 2020-August).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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On-Wafer Coplanar Waveguide Standards for S-Parameter Measurements of Balanced Circuits Up to 40 GHz
Pham, T. D., Allal, D., Ziade, F. & Bergeault, E., 1 Jun 2019, In: IEEE Transactions on Instrumentation and Measurement. 68, 6, p. 2160-2167 8 p., 8699095.Research output: Contribution to journal › Article › peer-review
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Pulsed characterisation of trapping dynamics in AlGaN/GaN HEMTs
Nakkala, P., Martin, A., Campovecchio, M., Laurent, S., Bouysse, P., Bergeault, E., Quéré, R., Jardel, O. & Piotrowicz, S., 24 Oct 2013, In: Electronics Letters. 49, 22, p. 1406-1407 2 p.Research output: Contribution to journal › Article › peer-review
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Nonlinear modeling of RF thermistor: Application to bolometer mount calibration
Kazemipour, A., Ziadé, F., Allal, D., Jenu, M. Z. M. & Bergeault, E., 1 Jul 2011, In: IEEE Transactions on Instrumentation and Measurement. 60, 7, p. 2445-2448 4 p., 5629363.Research output: Contribution to journal › Article › peer-review
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A millimeter wave six-port reflectometer for active load-pull characterization
Mohellebi, R., Bergeault, E., Abib, G. I. & Huyart, B., 17 Dec 2010, European Microwave Week 2010, EuMW2010: Connecting the World, Conference Proceedings - European Microwave Conference, EuMC 2010. p. 1575-1578 4 p. 5616226. (European Microwave Week 2010, EuMW2010: Connecting the World, Conference Proceedings - European Microwave Conference, EuMC 2010).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Non-linear modeling of RF thermistor, application to bolometer mount calibration
Kazemipour, A., Ziade, F., Allal, D., Bergeault, E. & Litwin, A., 21 Sept 2010, 2010 Conference on Precision Electromagnetic Measurements, CPEM 2010. p. 698-699 2 p. 5544177. (CPEM Digest (Conference on Precision Electromagnetic Measurements)).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Realization of a calculable RF power standard in coplanar technology on alumina substrate
Ziadé, F., Bergeault, E., Huyart, B. & Kazemipour, A., 1 Jun 2010, In: IEEE Transactions on Microwave Theory and Techniques. 58, 6, p. 1592-1598 7 p., 5463027.Research output: Contribution to journal › Article › peer-review
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Determination of the reference impedance of Line-Attenuator-Reflect for on-wafer vector network analyzer calibration
Bahouche, M., Bergeault, E. & Allal, D., 25 Nov 2009, 2009 IEEE Intrumentation and Measurement Technology Conference, I2MTC 2009. p. 642-645 4 p. 5168529. (2009 IEEE Intrumentation and Measurement Technology Conference, I2MTC 2009).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Power amplifier optimization using base band and multiharmonic source/load-pull characterization with digital predistortion
Abib, G. I., Bergeault, E., Bensmida, S. & Mohellebi, R., 1 Aug 2009, In: International Journal of Microwave and Wireless Technologies. 1, 4, p. 255-260 6 p.Research output: Contribution to journal › Article › peer-review
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An original setup for power amplifier AM-AM and AM-PM Characterization
Bensmida, S., Ghannouchi, F. M. & Bergeault, E., 15 Sept 2008, 2008 IEEE International Instrumentation and Measurement Technology Conference Proceedings, I2MTC. p. 54-57 4 p. 4547003. (Conference Record - IEEE Instrumentation and Measurement Technology Conference).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review