A fault model for conducted intentional electromagnetic interferences

  • Laurent Sauvage
  • , Sylvain Guilley
  • , Jean Luc Danger
  • , Naofumi Homma
  • , Yu Ichi Hayashi

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Experimental setups used in electromagnetic compatibility tests can be used as platforms for fault injections. Faulting an equipment is a mean for a malevolent attacker to extract secret information. Compared to other fault injection setups, those based on EMC tests provide three advantages: non-invasivity, absence of synchronization, and frequency selectivity. This injection technique therefore allows the attacker to perform analysis with little knowledge of the targeted equipment. To assess the potential of this attack, a characterization of its effects is needed. This is the purpose of this paper. More precisely, our contributions are twofold: First of all, we observe that the faults are reproducible. Second, we show that the fault model is compatible with known attacks.

Original languageEnglish
Title of host publicationEMC 2012 - 2012 IEEE International Symposium on Electromagnetic Compatibility, Final Program
Pages788-793
Number of pages6
DOIs
Publication statusPublished - 12 Dec 2012
Externally publishedYes
Event2012 IEEE International Symposium on Electromagnetic Compatibility, EMC 2012 - Pittsburgh, PA, United States
Duration: 5 Aug 201210 Aug 2012

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118

Conference

Conference2012 IEEE International Symposium on Electromagnetic Compatibility, EMC 2012
Country/TerritoryUnited States
CityPittsburgh, PA
Period5/08/1210/08/12

Fingerprint

Dive into the research topics of 'A fault model for conducted intentional electromagnetic interferences'. Together they form a unique fingerprint.

Cite this