TY - JOUR
T1 - A simple experimental procedure to quantify image noise in the context of strain measurements at the microscale using DIC and SEM images
AU - Wang, L. L.
AU - Heripre, E.
AU - El Outmani, S.
AU - Caldemaison, D.
AU - Bornert, M.
N1 - Publisher Copyright:
© 2010 Owned by the authors, published by EDP Sciences.
PY - 2010/6/9
Y1 - 2010/6/9
N2 - Image noise is an important factor that ino, uences the accuracy of strain field measurements by means of digital image correlation and scanning electron microscope (SEM) imaging. We propose a new model to quantify the SEM image noise, which extends the classical photon noise model by taking into account the brightness setup in SEM imaging. Furthermore, we apply this model to investigate the impact of dio, erent SEM setting parameters on image noise, such as detector, dwell time, spot size, and pressure in the SEM chamber in the context of low vacuum imaging.
AB - Image noise is an important factor that ino, uences the accuracy of strain field measurements by means of digital image correlation and scanning electron microscope (SEM) imaging. We propose a new model to quantify the SEM image noise, which extends the classical photon noise model by taking into account the brightness setup in SEM imaging. Furthermore, we apply this model to investigate the impact of dio, erent SEM setting parameters on image noise, such as detector, dwell time, spot size, and pressure in the SEM chamber in the context of low vacuum imaging.
UR - https://www.scopus.com/pages/publications/84908163755
U2 - 10.1051/epjconf/20100640008
DO - 10.1051/epjconf/20100640008
M3 - Conference article
AN - SCOPUS:84908163755
SN - 2101-6275
VL - 6
JO - EPJ Web of Conferences
JF - EPJ Web of Conferences
M1 - 40008
T2 - 14th International Conference on Experimental Mechanics, ICEM 2014
Y2 - 4 July 2010 through 9 July 2010
ER -