TY - GEN
T1 - A simple fault-tolerant digital voter circuit in TMR nanoarchitectures
AU - Ban, Tian
AU - De Barros Naviner, Lirida Alves
PY - 2010/11/22
Y1 - 2010/11/22
N2 - Nanoelectronic systems are now more and more pr one to faults and defects, permanent or transient. Redundancy te chniques are implemented widely to increase the reliability, especially the TMR - Triple Modular Redundancy. However, many researchers assume that the voter is perfect and this may not be true. This paper proposes a simple but effective fault-tolerant voter circuit which is more reliable and less expensive. Experimental results demonstrate its improvement over the fo rmer TMR structures.
AB - Nanoelectronic systems are now more and more pr one to faults and defects, permanent or transient. Redundancy te chniques are implemented widely to increase the reliability, especially the TMR - Triple Modular Redundancy. However, many researchers assume that the voter is perfect and this may not be true. This paper proposes a simple but effective fault-tolerant voter circuit which is more reliable and less expensive. Experimental results demonstrate its improvement over the fo rmer TMR structures.
U2 - 10.1109/NEWCAS.2010.5603933
DO - 10.1109/NEWCAS.2010.5603933
M3 - Conference contribution
AN - SCOPUS:78349273070
SN - 9781424468058
T3 - Proceedings of the 8th IEEE International NEWCAS Conference, NEWCAS2010
SP - 269
EP - 272
BT - Proceedings of the 8th IEEE International NEWCAS Conference, NEWCAS2010
T2 - 8th IEEE International NEWCAS Conference, NEWCAS 2010
Y2 - 20 June 2010 through 23 June 2010
ER -