A synchrotron Si2p and As3d core level study of the As-terminated Si(001) surface oxidation

C. Poncey, F. Rochet, G. Dufour, H. Roulet, W. N. Rodrigues, M. Sauvage-Simkin, J. C. Boulliard, F. Sirotti, G. Panaccione

Research output: Contribution to journalArticlepeer-review

Abstract

The resistance of the As-terminated Si(001) surface to oxidation in O2 is the subject of this study. Photoemission spectra of As3d and Si2p core levels excited with synchrotron radiation reveals that spectral changes are evident, simultaneously for As and Si, only from ∼1012 L (Langmuir) on, in stark contrast with a previous report indicating a saturation coverage in the 400–2000 L range. Oxidation proceeds slowly, as dimerized As remain intact (∼24%) up to exposures of ∼1013 L. In the oxidized areas, the four Si oxidation states (indicative of subsurface oxidation) and three As oxidation states plus metallic arsenic show up. This suggests a reduction of the arsenic oxide by silicon. Arsenic losses are also observed, probably via sublimation of As4O6 molecules.

Original languageEnglish
Pages (from-to)40-44
Number of pages5
JournalJournal of Non-Crystalline Solids
Volume187
DOIs
Publication statusPublished - 1 Jan 1995
Externally publishedYes

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