A wavelet analysis of the Rosenblatt process: Chaos expansion and estimation of the self-similarity parameter

J. M. Bardet, C. A. Tudor

Research output: Contribution to journalArticlepeer-review

Abstract

By using chaos expansion into multiple stochastic integrals, we make a wavelet analysis of two self-similar stochastic processes: the fractional Brownian motion and the Rosenblatt process. We study the asymptotic behavior of the statistic based on the wavelet coefficients of these processes. Basically, when applied to a non-Gaussian process (such as the Rosenblatt process) this statistic satisfies a non-central limit theorem even when we increase the number of vanishing moments of the wavelet function. We apply our limit theorems to construct estimators for the self-similarity index and we illustrate our results by simulations.

Original languageEnglish
Pages (from-to)2331-2362
Number of pages32
JournalStochastic Processes and their Applications
Volume120
Issue number12
DOIs
Publication statusPublished - 1 Dec 2010
Externally publishedYes

Keywords

  • Fractional Brownian motion
  • Multiple Wiener-It integral
  • Noncentral limit theorem
  • Parameter estimation
  • Rosenblatt process
  • Self-similarity
  • Wavelet analysis

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