Abstract
Here, we show that a prediction of conductivity in composites can be improved by replacing fitting parameters of the percolation models by information on composite's microstructure. The methodology was demonstrated on the modified McCullough's structure-oriented model combined with current maps obtained by Conductive Atomic Force Microscopy (CA-AFM). The approach was tested on nanocomposites with graphene nanoplatelets (GNPs/PS) and proved to be coherent with experimental conductivity measurements and able to predict a percolation threshold. For the composite GNPs/PS both experimental and calculated percolation thresholds are approximately equal to 0.9. wt.% of GNPs. The model can be used for a prediction of conductivity of different kinds of conductive-dielectric composites.
| Original language | English |
|---|---|
| Pages (from-to) | 38-43 |
| Number of pages | 6 |
| Journal | Composites Science and Technology |
| Volume | 95 |
| DOIs | |
| Publication status | Published - 1 May 2014 |
| Externally published | Yes |
Keywords
- Atomic force microscopy (AFM)
- Electrical properties
- Modeling
- Nanocomposites
- Scanning electron microscopy (SEM)
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