@inproceedings{c23a8e0c6f8e497d8f3d16e26f0f0236,
title = "Alternate multilayer gratings with enhanced diffraction efficiency in the 500-5000 eV energy domain",
abstract = "An alternate multilayer (AML) grating is a 2 dimensional diffraction structure formed on an optical surface, having a 0.5 duty cycle in the in-plane and in the in-depth direction. It can be made by covering a shallow depth laminar grating with a multilayer stack. We show here that their 2D structure confer AML gratings a high angular and energetic selectivity and therefore enhanced diffraction properties, when used in grazing incidence. In the tender X-ray range (500eV - 5000 eV) they behave much like blazed gratings. Over 15\% efficiency has been measured on a 1200 lines/mm Mo/Si AML grating in the 1.2 - 1.5 keV energy range. Computer simulations show that selected multilayer materials such as Cr/C should allow diffraction efficiency over 50\% at photon energies over 3 keV.",
keywords = "Diffraction efficiency, Grating, Grazing incidence, Multilayer, X-rays",
author = "Fran{\c c}ois Polack and Bruno Lagarde and Mourad Idir and Cloup, \{Audrey Liard\} and Erick Jourdain and Marc Roulliay and Franck Delmotte and Julien Gautier and Ravet-Krill, \{Marie Fran{\c c}oise\}",
year = "2007",
month = mar,
day = "26",
doi = "10.1063/1.2436105",
language = "English",
isbn = "0735403732",
series = "AIP Conference Proceedings",
pages = "489--492",
booktitle = "SYNCHROTRON RADIATION INSTRUMENTATION",
note = "SYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation ; Conference date: 28-05-2006 Through 28-06-2006",
}