An accurate and contrast invariant junction detector

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper introduces a generic method for the accurate analysis of junctions, relying on a statistical modeling of normalized image gradients. We analyze junctions as local visual events that do not happen by chance under a background model derived from the a-contrario methodology. The method not only provides thresholds for the detection of junctions, but also enables their accurate characterization, including a precise computation of their type, localization, scale and geometrical configuration. The efficiency of the method is evaluated through various experiments.

Original languageEnglish
Title of host publicationICPR 2012 - 21st International Conference on Pattern Recognition
Pages2780-2783
Number of pages4
Publication statusPublished - 1 Dec 2012
Externally publishedYes
Event21st International Conference on Pattern Recognition, ICPR 2012 - Tsukuba, Japan
Duration: 11 Nov 201215 Nov 2012

Publication series

NameProceedings - International Conference on Pattern Recognition
ISSN (Print)1051-4651

Conference

Conference21st International Conference on Pattern Recognition, ICPR 2012
Country/TerritoryJapan
CityTsukuba
Period11/11/1215/11/12

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