An apparatus for temperature-dependent soft X-ray resonant magnetic scattering

Nicolas Jaouen; Jean Marc Tonnerre; Grigor Kapoujian; Pierre Taunier; Jean Paul Roux; Denis Raoux; Fausto Sirotti

doi:10.1107/S0909049504013767

An apparatus for temperature-dependent soft X-ray resonant magnetic scattering

Nicolas Jaouen
, Jean Marc Tonnerre
, Grigor Kapoujian
, Pierre Taunier
, Jean Paul Roux
, Denis Raoux
, Fausto Sirotti

Research output: Contribution to journal › Article › peer-review

Abstract

Interest in the use of soft X-ray resonant magnetic scattering techniques to probe the distribution of magnetic moments in thin films has exploded during the last few years. In this paper a novel diffractometer devoted to temperature-dependent soft X-ray resonant scattering is described. The principal features of the diffractometer are presented and illustrated through experiments performed at LURE during the commissioning phase.

Original language	English
Pages (from-to)	353-357
Number of pages	5
Journal	Journal of Synchrotron Radiation
Volume	11
Issue number	4
DOIs	https://doi.org/10.1107/S0909049504013767
Publication status	Published - 1 Jul 2004
Externally published	Yes

Keywords

X-ray magnetic scattering

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10.1107/S0909049504013767

Cite this

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title = "An apparatus for temperature-dependent soft X-ray resonant magnetic scattering",

abstract = "Interest in the use of soft X-ray resonant magnetic scattering techniques to probe the distribution of magnetic moments in thin films has exploded during the last few years. In this paper a novel diffractometer devoted to temperature-dependent soft X-ray resonant scattering is described. The principal features of the diffractometer are presented and illustrated through experiments performed at LURE during the commissioning phase.",

keywords = "X-ray magnetic scattering",

author = "Nicolas Jaouen and Tonnerre, \{Jean Marc\} and Grigor Kapoujian and Pierre Taunier and Roux, \{Jean Paul\} and Denis Raoux and Fausto Sirotti",

year = "2004",

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doi = "10.1107/S0909049504013767",

language = "English",

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AU - Jaouen, Nicolas

AU - Tonnerre, Jean Marc

AU - Kapoujian, Grigor

AU - Taunier, Pierre

AU - Roux, Jean Paul

AU - Raoux, Denis

AU - Sirotti, Fausto

PY - 2004/7/1

Y1 - 2004/7/1

N2 - Interest in the use of soft X-ray resonant magnetic scattering techniques to probe the distribution of magnetic moments in thin films has exploded during the last few years. In this paper a novel diffractometer devoted to temperature-dependent soft X-ray resonant scattering is described. The principal features of the diffractometer are presented and illustrated through experiments performed at LURE during the commissioning phase.

AB - Interest in the use of soft X-ray resonant magnetic scattering techniques to probe the distribution of magnetic moments in thin films has exploded during the last few years. In this paper a novel diffractometer devoted to temperature-dependent soft X-ray resonant scattering is described. The principal features of the diffractometer are presented and illustrated through experiments performed at LURE during the commissioning phase.

KW - X-ray magnetic scattering

UR - https://www.scopus.com/pages/publications/11844249968

U2 - 10.1107/S0909049504013767

DO - 10.1107/S0909049504013767

M3 - Article

AN - SCOPUS:11844249968

SN - 0909-0495

VL - 11

SP - 353

EP - 357

JO - Journal of Synchrotron Radiation

JF - Journal of Synchrotron Radiation

IS - 4

ER -

An apparatus for temperature-dependent soft X-ray resonant magnetic scattering

Abstract

Keywords

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