Analytical methods for AMC and EBG characterizations

M. Grelier; F. Linot; A. C. Lepage; X. Begaud; J. M. Lemener; M. Soiron

doi:10.1007/s00339-011-6255-x

Analytical methods for AMC and EBG characterizations

M. Grelier
, F. Linot
, A. C. Lepage
, X. Begaud
, J. M. Lemener
, M. Soiron

CNRS LTCI
Thales Group

Research output: Contribution to journal › Article › peer-review

14 Citations (Scopus)

Abstract

AMC and EBG behaviors are respectively characterized by reflection phase method and dispersion diagram. A fast and simple analytical model based on transmission line theory is proposed for each analysis. The validity of these analytical methods is verified by a comparison between circuit representations, measurements and numerical results.

Original language	English
Pages (from-to)	805-808
Number of pages	4
Journal	Applied Physics A: Materials Science and Processing
Volume	103
Issue number	3
DOIs	https://doi.org/10.1007/s00339-011-6255-x
Publication status	Published - 1 Jan 2011
Externally published	Yes

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title = "Analytical methods for AMC and EBG characterizations",

abstract = "AMC and EBG behaviors are respectively characterized by reflection phase method and dispersion diagram. A fast and simple analytical model based on transmission line theory is proposed for each analysis. The validity of these analytical methods is verified by a comparison between circuit representations, measurements and numerical results.",

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AU - Lemener, J. M.

AU - Soiron, M.

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N2 - AMC and EBG behaviors are respectively characterized by reflection phase method and dispersion diagram. A fast and simple analytical model based on transmission line theory is proposed for each analysis. The validity of these analytical methods is verified by a comparison between circuit representations, measurements and numerical results.

AB - AMC and EBG behaviors are respectively characterized by reflection phase method and dispersion diagram. A fast and simple analytical model based on transmission line theory is proposed for each analysis. The validity of these analytical methods is verified by a comparison between circuit representations, measurements and numerical results.

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JO - Applied Physics A: Materials Science and Processing

JF - Applied Physics A: Materials Science and Processing

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Analytical methods for AMC and EBG characterizations

Abstract

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