Analytical methods to assess transient faults effects in logic circuits

Lirida Alves De Barros Naviner

doi:10.1109/MWSCAS.2014.6908503

Analytical methods to assess transient faults effects in logic circuits

Lirida Alves De Barros Naviner

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

This work addresses transient faults in deep submicron technologies. We focus on reliability assessment approaches highlighting those based on analytical models. The paper includes a description of solutions reported in the literature and discusses their suitability from a reliability improvement perspective.

Original language	English
Title of host publication	2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	667-670
Number of pages	4
ISBN (Electronic)	9781479941346, 9781479941346
DOIs	https://doi.org/10.1109/MWSCAS.2014.6908503
Publication status	Published - 23 Sept 2014
Event	2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014 - College Station, United States Duration: 3 Aug 2014 → 6 Aug 2014

Publication series

Name	Midwest Symposium on Circuits and Systems
ISSN (Print)	1548-3746

Conference

Conference	2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014
Country/Territory	United States
City	College Station
Period	3/08/14 → 6/08/14

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10.1109/MWSCAS.2014.6908503

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Alves De Barros Naviner, L. (2014). Analytical methods to assess transient faults effects in logic circuits. In 2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014 (pp. 667-670). Article 6908503 (Midwest Symposium on Circuits and Systems). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MWSCAS.2014.6908503

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abstract = "This work addresses transient faults in deep submicron technologies. We focus on reliability assessment approaches highlighting those based on analytical models. The paper includes a description of solutions reported in the literature and discusses their suitability from a reliability improvement perspective.",

author = "\{Alves De Barros Naviner\}, Lirida",

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doi = "10.1109/MWSCAS.2014.6908503",

language = "English",

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Alves De Barros Naviner, L 2014, Analytical methods to assess transient faults effects in logic circuits. in 2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014., 6908503, Midwest Symposium on Circuits and Systems, Institute of Electrical and Electronics Engineers Inc., pp. 667-670, 2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014, College Station, United States, 3/08/14. https://doi.org/10.1109/MWSCAS.2014.6908503

Analytical methods to assess transient faults effects in logic circuits. / Alves De Barros Naviner, Lirida.
2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014. Institute of Electrical and Electronics Engineers Inc., 2014. p. 667-670 6908503 (Midwest Symposium on Circuits and Systems).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AB - This work addresses transient faults in deep submicron technologies. We focus on reliability assessment approaches highlighting those based on analytical models. The paper includes a description of solutions reported in the literature and discusses their suitability from a reliability improvement perspective.

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BT - 2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014

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T2 - 2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014

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Analytical methods to assess transient faults effects in logic circuits

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