Applications of intense ultra-short XUV pulses to solid state physics: Time-resolved luminescence spectroscopy and radiation damage studies

  • M. De Grazia
  • , H. Merdji
  • , B. Carré
  • , J. Gaudin
  • , G. Geoffroy
  • , S. Guizard
  • , N. Fedorov
  • , A. Belsky
  • , P. Martin
  • , M. Kirm
  • , V. Babin
  • , E. Feldbach
  • , S. Vielhauer
  • , V. Nagirnyi
  • , A. Vassil'Ev
  • , F. Krejci
  • , J. Kuba
  • , J. Chalupsky
  • , J. Cihelka
  • , V. Hajkova
  • M. Ledinský, L. Juha

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The new XUV sources, which deliver spatially coherent pulses of high peak power, allow to study elementary processes in the light/solid interaction in the high intensity regime (> 1011 W/cm2). Here, we report two studies which have used high-order laser harmonics (HH) generated in gas as the excitation source. Firstly, we have investigated the dynamics of electron relaxation in the wide gap CdWO4 dielectric crystal, an efficient scintillator material, using time-resolved luminescence spectroscopy. The kinetics decay of luminescence shows evidence of non radiative relaxation of the self-trapped excitons at the μs damage to surfaces of poly(methyl methacrylate) - PMMA, induced by a multi-shot XUV-irradiation (1 kHz reprate) for given fluence, below damage threshold range of ≈ mJ/cm2. The main processes participating in the surface modification, polymer chain scission followed by the blow up of the volatile, molecular fragments and cross-linking in the near-surface layer of remaining material, are tentatively identified and associated to, crater formation for short-time exposure (< 1 min) and surface hardening for long-time exposure (≥ 1 min).

Original languageEnglish
Title of host publicationDamage to VUV, EUV, and X-ray Optics
DOIs
Publication statusPublished - 19 Nov 2007
Externally publishedYes
EventDamage to VUV, EUV, and X-ray Optics - Prague, Czech Republic
Duration: 18 Apr 200719 Apr 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6586
ISSN (Print)0277-786X

Conference

ConferenceDamage to VUV, EUV, and X-ray Optics
Country/TerritoryCzech Republic
CityPrague
Period18/04/0719/04/07

Keywords

  • Electron relaxation dynamic
  • High order harmonics
  • Polymers
  • Scintillator materials
  • XUV damage mechanisms

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