Approximate Analytical Model Evaluating Digital Systems Compliance with Automotive Standards

  • Esther Goudet
  • , Fabio Sureau
  • , Manan Kaila
  • , Rémi Germe
  • , Luis Peña Treviño
  • , Jean Marc Daveau
  • , Lirida Naviner
  • , Philippe Roche

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper revisits the existing Clustering Probabilistic Binomial Reliability (CPBR) approximate analytical model based on circuit partitioning and signal transfer matrices. It demonstrates the model’s relevance in assessing the correctness rate of logic gate netlists, in accordance with the ISO26262 road safety standard. The paper also highlights the model’s applicability to typical industrial circuit netlists. While prior work established the CPBR model’s ability to efficiently propagate signal error rates to circuit outputs with reasonable accuracy, no prior work has comprehensively compared its correctness rates to those of its reference Probabilistic Binomial Reliability (PBR) model. The novel CPBR implementation used in this paper enables, for the first time, a detailed accuracy comparison between the partitioning model and its reference across multiple circuits of the ISCAS’85 benchmark suite. Additionally, we provide an in-depth analysis of how this approximate method impacts the Automotive Safety Integrity Level (ASIL) for these circuits, identifying the optimal ASIL target for its application. Finally, we showcase the practical relevance of our approach by successfully applying it to the complex peripheral netlists of an industrial test-chip embedding a RISC-V core, demonstrating both its scalability and effectiveness in real-world scenarios.

Original languageEnglish
Title of host publication2025 IEEE 26th Latin American Test Symposium, LATS 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665477635
DOIs
Publication statusPublished - 1 Jan 2025
Event26th IEEE Latin American Test Symposium, LATS 2025 - San Andres Islas, Colombia
Duration: 11 Mar 202514 Mar 2025

Publication series

Name2025 IEEE 26th Latin American Test Symposium, LATS 2025

Conference

Conference26th IEEE Latin American Test Symposium, LATS 2025
Country/TerritoryColombia
CitySan Andres Islas
Period11/03/2514/03/25

Keywords

  • Analytical model
  • Circuit partitioning
  • Combinatorial analysis
  • SETs
  • SEUs

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