Atomic-scale analysis of interfaces in an all-oxide magnetic tunnel junction

  • J. L. Maurice
  • , F. Pailloux
  • , D. Imhoff
  • , N. Bonnet
  • , L. Samet
  • , A. Barthelemy
  • , J. P. Contour
  • , C. Colliex
  • , A. Fert

Research output: Contribution to journalArticlepeer-review

Abstract

We use High Resolution Electron Microscopy (HRTEM) together with Electron Energy Loss Spectroscopy (EELS) to analyze the crystallography and the chemical configuration of interfaces in a state-of-the-art La2/3Sr1/3MnO3/SrTiO3/ La2/3Sr1/3MnO3 tunnel junction. EELS indicates that manganese ions keep their bulk valency up to the last atomic plane in contact with the insulator. Tunnel magnetoresistance however decreases with temperature faster than magnetisation in these samples. Quantitative HRTEM reveals some local departures from chemical abruptness at the interfaces, which could play a role in this decrease.

Original languageEnglish
Pages (from-to)215-221
Number of pages7
JournalEPJ Applied Physics
Volume24
Issue number3
DOIs
Publication statusPublished - 1 Jan 2003

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