Atomic spectral analyzers for radio frequency signal processing

J. L. Le Gouët; I. Lorgeré; F. Bretenaker; V. Lavielle; V. Crozatier

Atomic spectral analyzers for radio frequency signal processing

J. L. Le Gouët
, I. Lorgeré
, F. Bretenaker
, V. Lavielle
, V. Crozatier

Laboratoire Aimé Cotton

Research output: Contribution to journal › Conference article › peer-review

Abstract

We review recent demonstrations of wide band radio frequency (RF) spectral analyzers based on spectral hole burning technology. The optically-carried RF signal can be analyzed with sub-MHz resolution over tens of GHz instantaneous bandwidth.

Original language	English
Pages (from-to)	931-932
Number of pages	2
Journal	Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Volume	2
Publication status	Published - 1 Dec 2004
Externally published	Yes
Event	2004 IEEE LEOS Annual Meeting Conference Proceedings, LEOS 2004 - Rio Grande, Puerto Rico Duration: 7 Nov 2004 → 11 Nov 2004

Cite this

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title = "Atomic spectral analyzers for radio frequency signal processing",

abstract = "We review recent demonstrations of wide band radio frequency (RF) spectral analyzers based on spectral hole burning technology. The optically-carried RF signal can be analyzed with sub-MHz resolution over tens of GHz instantaneous bandwidth.",

author = "\{Le Gou{\"e}t\}, \{J. L.\} and I. Lorger{\'e} and F. Bretenaker and V. Lavielle and V. Crozatier",

year = "2004",

month = dec,

day = "1",

language = "English",

volume = "2",

pages = "931--932",

journal = "Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS",

issn = "1092-8081",

note = "2004 IEEE LEOS Annual Meeting Conference Proceedings, LEOS 2004 ; Conference date: 07-11-2004 Through 11-11-2004",

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TY - JOUR

T1 - Atomic spectral analyzers for radio frequency signal processing

AU - Le Gouët, J. L.

AU - Lorgeré, I.

AU - Bretenaker, F.

AU - Lavielle, V.

AU - Crozatier, V.

PY - 2004/12/1

Y1 - 2004/12/1

N2 - We review recent demonstrations of wide band radio frequency (RF) spectral analyzers based on spectral hole burning technology. The optically-carried RF signal can be analyzed with sub-MHz resolution over tens of GHz instantaneous bandwidth.

AB - We review recent demonstrations of wide band radio frequency (RF) spectral analyzers based on spectral hole burning technology. The optically-carried RF signal can be analyzed with sub-MHz resolution over tens of GHz instantaneous bandwidth.

M3 - Conference article

AN - SCOPUS:14344254629

SN - 1092-8081

VL - 2

SP - 931

EP - 932

JO - Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

JF - Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

T2 - 2004 IEEE LEOS Annual Meeting Conference Proceedings, LEOS 2004

Y2 - 7 November 2004 through 11 November 2004

ER -

Atomic spectral analyzers for radio frequency signal processing

Abstract

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