Skip to main navigation Skip to search Skip to main content

Automated characterization of HF power transistors by source-pull and multiharmonic load-pull measurements based on six-port techniques

  • Telecom Paris
  • Nokia GmbH

Research output: Contribution to journalArticlepeer-review

27 Citations (Scopus)

Abstract

An original measurement system for nonlinear microwave power-transistor characterization using six-port reflectometers is presented. It allows independent active tuning of the output impedances at fo and 2/o (multiharmonic load-pull) and variation of the source impedance at the input port at fo (source-pull). An appropriate search algorithm enables automatic optimization of the output impedances and leads to fast user-friendly operation of the system. Experimental results are shown for a commercial GaAs MESFET power transistor at fo - 2 GHz.

Original languageEnglish
Pages (from-to)2068-2073
Number of pages6
JournalIEEE Transactions on Microwave Theory and Techniques
Volume46
Issue number12 PART 1
DOIs
Publication statusPublished - 1 Dec 1998
Externally publishedYes

Keywords

  • Load-pull
  • Measurement automation
  • Multiharmonic
  • Nonlinear
  • Six-port
  • Source-pull

Fingerprint

Dive into the research topics of 'Automated characterization of HF power transistors by source-pull and multiharmonic load-pull measurements based on six-port techniques'. Together they form a unique fingerprint.

Cite this