TY - GEN
T1 - Automatic landmark location with a combined active shape model
AU - Zhou, Dianle
AU - Petrovska-Delacrétaz, Dijana
AU - Dorizzi, Bernadette
PY - 2009/1/1
Y1 - 2009/1/1
N2 - Automatic facial landmark location is a difficult challenge for realistic face recognition applications, where the face is recorded under variable illumination conditions including indoor and outdoor recordings and also with some pose and scale variability. Moreover, the image distortion and complex background also bring some difficulty both for landmark location and face recognition. The proposed landmark detection method, called Combined Active Shape Models, is robust to illumination, translation, and rotation. It exploits the Scale Invariant Feature Transform (SIFT) [1] and the Active Shape Model (ASM) [2]. In order to have a better representation of face images, the landmarks on the face region and the face contour are modeled and processed separately. The performance of the proposed Combined-ASM algorithm is tested on the BioID and FRGCv2.0 face image databases.
AB - Automatic facial landmark location is a difficult challenge for realistic face recognition applications, where the face is recorded under variable illumination conditions including indoor and outdoor recordings and also with some pose and scale variability. Moreover, the image distortion and complex background also bring some difficulty both for landmark location and face recognition. The proposed landmark detection method, called Combined Active Shape Models, is robust to illumination, translation, and rotation. It exploits the Scale Invariant Feature Transform (SIFT) [1] and the Active Shape Model (ASM) [2]. In order to have a better representation of face images, the landmarks on the face region and the face contour are modeled and processed separately. The performance of the proposed Combined-ASM algorithm is tested on the BioID and FRGCv2.0 face image databases.
U2 - 10.1109/BTAS.2009.5339037
DO - 10.1109/BTAS.2009.5339037
M3 - Conference contribution
AN - SCOPUS:71749098189
SN - 9781424450206
T3 - IEEE 3rd International Conference on Biometrics: Theory, Applications and Systems, BTAS 2009
BT - IEEE 3rd International Conference on Biometrics
PB - IEEE Computer Society
T2 - 3rd IEEE International Conference on Biometrics: Theory, Applications and Systems, BTAS 2009
Y2 - 28 September 2009 through 30 September 2009
ER -