Biaxial stress measurement through polarized oblique incidence Raman spectroscopy

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	XXII International Conference on Raman Spectroscopy, ICORS 2010
Pages	1152-1153
Number of pages	2
DOIs	https://doi.org/10.1063/1.3482352
Publication status	Published - 14 Dec 2010
Event	22nd International Conference on Raman Spectroscopy, ICORS 2010 - Boston, MA, United States Duration: 8 Aug 2010 → 13 Aug 2010

Conference	22nd International Conference on Raman Spectroscopy, ICORS 2010
Country/Territory	United States
City	Boston, MA
Period	8/08/10 → 13/08/10

Access to Document

@inproceedings{54cf83f783a74c618a24883953054db2,

title = "Biaxial stress measurement through polarized oblique incidence Raman spectroscopy",

author = "Alexandre Frigout and Christophe Licitra and Razvigor Ossikovski",

year = "2010",

month = dec,

day = "14",

doi = "10.1063/1.3482352",

language = "English",

isbn = "9780735408180",

series = "AIP Conference Proceedings",

pages = "1152--1153",

booktitle = "XXII International Conference on Raman Spectroscopy, ICORS 2010",

note = "22nd International Conference on Raman Spectroscopy, ICORS 2010 ; Conference date: 08-08-2010 Through 13-08-2010",

}

Frigout, A, Licitra, C & Ossikovski, R 2010, Biaxial stress measurement through polarized oblique incidence Raman spectroscopy. in XXII International Conference on Raman Spectroscopy, ICORS 2010. AIP Conference Proceedings, vol. 1267, pp. 1152-1153, 22nd International Conference on Raman Spectroscopy, ICORS 2010, Boston, MA, United States, 8/08/10. https://doi.org/10.1063/1.3482352

Biaxial stress measurement through polarized oblique incidence Raman spectroscopy. / Frigout, Alexandre; Licitra, Christophe; Ossikovski, Razvigor.
XXII International Conference on Raman Spectroscopy, ICORS 2010. 2010. p. 1152-1153 (AIP Conference Proceedings; Vol. 1267).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Biaxial stress measurement through polarized oblique incidence Raman spectroscopy

AU - Frigout, Alexandre

AU - Licitra, Christophe

AU - Ossikovski, Razvigor

PY - 2010/12/14

Y1 - 2010/12/14

U2 - 10.1063/1.3482352

DO - 10.1063/1.3482352

M3 - Conference contribution

AN - SCOPUS:78649978964

SN - 9780735408180

T3 - AIP Conference Proceedings

SP - 1152

EP - 1153

BT - XXII International Conference on Raman Spectroscopy, ICORS 2010

T2 - 22nd International Conference on Raman Spectroscopy, ICORS 2010

Y2 - 8 August 2010 through 13 August 2010

ER -