Calibrated force measurement in atomic force microscopy using the transient fluctuation theorem

Samuel Albert; Aubin Archambault; Artyom Petrosyan; Caroline Crauste-Thibierge; Ludovic Bellon; Sergio Ciliberto

doi:10.1209/0295-5075/131/10008

Calibrated force measurement in atomic force microscopy using the transient fluctuation theorem

Samuel Albert, Aubin Archambault, Artyom Petrosyan, Caroline Crauste-Thibierge, Ludovic Bellon, Sergio Ciliberto

Research output: Contribution to journal › Article › peer-review

Abstract

The transient fluctuation theorem is used to calibrate an atomic force microscope by measuring the fluctuations of the work performed by a time-dependent force applied between a colloidal probe and the surface. From this measure one can easily extract the value of the interaction force and the relevant parameters of the cantilever. The results of this analysis are compared with those obtained by standard calibration methods.

Original language	English
Article number	10008
Journal	EPL
Volume	131
Issue number	1
DOIs	https://doi.org/10.1209/0295-5075/131/10008
Publication status	Published - 1 Jul 2020
Externally published	Yes

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title = "Calibrated force measurement in atomic force microscopy using the transient fluctuation theorem",

abstract = "The transient fluctuation theorem is used to calibrate an atomic force microscope by measuring the fluctuations of the work performed by a time-dependent force applied between a colloidal probe and the surface. From this measure one can easily extract the value of the interaction force and the relevant parameters of the cantilever. The results of this analysis are compared with those obtained by standard calibration methods.",

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AU - Albert, Samuel

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AU - Bellon, Ludovic

AU - Ciliberto, Sergio

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N2 - The transient fluctuation theorem is used to calibrate an atomic force microscope by measuring the fluctuations of the work performed by a time-dependent force applied between a colloidal probe and the surface. From this measure one can easily extract the value of the interaction force and the relevant parameters of the cantilever. The results of this analysis are compared with those obtained by standard calibration methods.

AB - The transient fluctuation theorem is used to calibrate an atomic force microscope by measuring the fluctuations of the work performed by a time-dependent force applied between a colloidal probe and the surface. From this measure one can easily extract the value of the interaction force and the relevant parameters of the cantilever. The results of this analysis are compared with those obtained by standard calibration methods.

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DO - 10.1209/0295-5075/131/10008

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SN - 0295-5075

VL - 131

JO - EPL

JF - EPL

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Calibrated force measurement in atomic force microscopy using the transient fluctuation theorem

Abstract

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