Caracterización de componentes fotónicos utilizando reflectometría óptica de baja coherencia

C. Palavicini; Y. Jaouën; P. Gallion; G. Campuzano

Caracterización de componentes fotónicos utilizando reflectometría óptica de baja coherencia

C. Palavicini
, Y. Jaouën
, P. Gallion
, G. Campuzano

Research output: Contribution to journal › Article › peer-review

Abstract

Optical low-coherence reflectometry has been succesfully applied to the characterization of photonic devices. This non-destructive and versatile technique permits the detection, localization and quantification of scattering discontinuities of optoelectronic devices, yielding an accurate and direct information of the optical properties of the device.

Original language	Spanish
Pages (from-to)	379-386
Number of pages	8
Journal	Revista Mexicana de Fisica
Volume	52
Issue number	4
Publication status	Published - 1 Jan 2006

Keywords

Optical low-coherence reflectometry
Photonic device characterization

Cite this

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title = "Caracterizaci{\'o}n de componentes fot{\'o}nicos utilizando reflectometr{\'i}a {\'o}ptica de baja coherencia",

abstract = "Optical low-coherence reflectometry has been succesfully applied to the characterization of photonic devices. This non-destructive and versatile technique permits the detection, localization and quantification of scattering discontinuities of optoelectronic devices, yielding an accurate and direct information of the optical properties of the device.",

keywords = "Optical low-coherence reflectometry, Photonic device characterization",

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year = "2006",

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T1 - Caracterización de componentes fotónicos utilizando reflectometría óptica de baja coherencia

AU - Palavicini, C.

AU - Jaouën, Y.

AU - Gallion, P.

AU - Campuzano, G.

PY - 2006/1/1

Y1 - 2006/1/1

N2 - Optical low-coherence reflectometry has been succesfully applied to the characterization of photonic devices. This non-destructive and versatile technique permits the detection, localization and quantification of scattering discontinuities of optoelectronic devices, yielding an accurate and direct information of the optical properties of the device.

AB - Optical low-coherence reflectometry has been succesfully applied to the characterization of photonic devices. This non-destructive and versatile technique permits the detection, localization and quantification of scattering discontinuities of optoelectronic devices, yielding an accurate and direct information of the optical properties of the device.

KW - Optical low-coherence reflectometry

KW - Photonic device characterization

UR - https://www.scopus.com/pages/publications/33750030132

M3 - Article

AN - SCOPUS:33750030132

SN - 0035-001X

VL - 52

SP - 379

EP - 386

JO - Revista Mexicana de Fisica

JF - Revista Mexicana de Fisica

IS - 4

ER -

Caracterización de componentes fotónicos utilizando reflectometría óptica de baja coherencia

Abstract

Keywords

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Cite this