Carrier escape from ground state and non-zero resonance frequency at low bias powers for semiconductor quantum-dot lasers

C. Wang, F. Grillot, J. Even

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The three-dimensional confinement of electrons and holes in the semiconductor quantum dot (QD) structure profoundly changes its density of states compared to the bulk semiconductor or the thin-film quantum well (QW) structure. The aim of this paper is to theoretically investigate the microwave properties of InAs/InP(311B) QD lasers. A new expression of the modulation transfer function is derived for the analysis of QD laser modulation properties based on a set of four rate equations. Analytical calculations point out that carrier escape from ground state (GS) to excited state (ES) induces a non-zero resonance frequency at low bias powers. Calculations also show that the carrier escape leads to a larger damping factor offset as compared to conventional QW lasers. These results are of prime importance for a better understanding of the carrier dynamics in QD lasers as well as for further optimization of low cost sources for optical telecommunications.

Original languageEnglish
Title of host publicationSemiconductor Lasers and Laser Dynamics V
DOIs
Publication statusPublished - 20 Jun 2012
Externally publishedYes
EventSemiconductor Lasers and Laser Dynamics V - Brussels, Belgium
Duration: 16 Apr 201219 Apr 2012

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8432
ISSN (Print)0277-786X

Conference

ConferenceSemiconductor Lasers and Laser Dynamics V
Country/TerritoryBelgium
CityBrussels
Period16/04/1219/04/12

Keywords

  • laser
  • modulation response
  • quantum dot
  • semiconductor

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