TY - JOUR
T1 - Cation Depth-Distribution at Alkali Halide Aqueous Solution Surfaces
AU - Tissot, Héloise
AU - Olivieri, Giorgia
AU - Gallet, Jean Jacques
AU - Bournel, Fabrice
AU - Silly, Mathieu G.
AU - Sirotti, Fausto
AU - Rochet, François
N1 - Publisher Copyright:
© 2015 American Chemical Society.
PY - 2015/4/30
Y1 - 2015/4/30
N2 - Using synchrotron radiation Near-Ambient Pressure X-ray photoemission spectroscopy (NAP-XPS) in surface and bulk sensitive conditions, we specifically explored the depth distribution of Na+ ions near the vapor/liquid interface of saturated solutions of sodium halides (NaCl, NaBr, and NaI) kept at 278 K under a pressure of 8 mbar. By varying the photoelectron kinetic energy, and hence the probing depth, we show that the Na+ depth distribution near the surface is highly sensitive to the size and polarizability of the anion. The large polarizable anions, Br- and I- that segregate at the surface, tend to drag the Na+ ions closer to the liquid-water surface. However, this situation is not observed for the NaCl solution, in line with recent theoretical results.
AB - Using synchrotron radiation Near-Ambient Pressure X-ray photoemission spectroscopy (NAP-XPS) in surface and bulk sensitive conditions, we specifically explored the depth distribution of Na+ ions near the vapor/liquid interface of saturated solutions of sodium halides (NaCl, NaBr, and NaI) kept at 278 K under a pressure of 8 mbar. By varying the photoelectron kinetic energy, and hence the probing depth, we show that the Na+ depth distribution near the surface is highly sensitive to the size and polarizability of the anion. The large polarizable anions, Br- and I- that segregate at the surface, tend to drag the Na+ ions closer to the liquid-water surface. However, this situation is not observed for the NaCl solution, in line with recent theoretical results.
U2 - 10.1021/jp512695c
DO - 10.1021/jp512695c
M3 - Article
AN - SCOPUS:84928901656
SN - 1932-7447
VL - 119
SP - 9253
EP - 9259
JO - Journal of Physical Chemistry C
JF - Journal of Physical Chemistry C
IS - 17
ER -