Skip to main navigation Skip to search Skip to main content

Cavity-enhanced real-time monitoring of single-charge jumps at the microsecond time scale

  • C. Arnold
  • , V. Loo
  • , A. Lemaître
  • , I. Sagnes
  • , O. Krebs
  • , P. Voisin
  • , P. Senellart
  • , L. Lanco
  • Centre national de la recherche scientifique
  • Laboratoire de Probabilités et Modèles Aléatoires

Research output: Contribution to journalArticlepeer-review

Abstract

We use fast coherent reflectivity measurements, in a strongly coupled quantum dot micropillar device, to monitor in real time single-charge jumps at the microsecond time scale. Thanks to the strong enhancement of light-matter interaction inside the cavity, and to a close to shot-noise-limited detection setup, the measurement rate is 5 orders of magnitude faster than with previous optical experiments of direct single-charge sensing with quantum dots. The monitored transitions, identified at any given time with a less than 0.2% error probability, correspond to a carrier being captured and then released by a single material defect. This high-speed technique opens the way for the real-time monitoring of other rapid single quantum events, such as the quantum jumps of a single spin.

Original languageEnglish
Article number021004
JournalPhysical Review X
Volume4
Issue number2
DOIs
Publication statusPublished - 1 Jan 2014

Keywords

  • Semiconductor physics

Fingerprint

Dive into the research topics of 'Cavity-enhanced real-time monitoring of single-charge jumps at the microsecond time scale'. Together they form a unique fingerprint.

Cite this