Characterisation of an X-ray laser beam

Research output: Contribution to journalArticlepeer-review

Abstract

We report in this article the experimental and numerical tools, developed at the LSAI, for a complete characterization of an X-ray laser (XRL) beam. First, a Michelson interferometer has been used to realize a Fourrier transform spectroscopy experiment. A full comprehension of the measured linewidth requires a comparaison of the XRL beam amplification in the plasma to raytrace simulation. Results of transient pumping XRL simulations are presented in this article. The last section is dedicated to a description of the XUV Shack-Hartmann wavefront sensor we have developed, and to the study of the capillary discharge XRL beam.

Original languageEnglish
Pages (from-to)23-34
Number of pages12
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4505
DOIs
Publication statusPublished - 1 Jan 2001
Externally publishedYes

Keywords

  • 3D raytrace
  • Capillary discharge X-ray laser
  • Fourier Transform spectroscopy
  • Michelson interferometer
  • Transient pumping X-ray laser
  • XUV wavefront sensor

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