Abstract
We report in this article the experimental and numerical tools, developed at the LSAI, for a complete characterization of an X-ray laser (XRL) beam. First, a Michelson interferometer has been used to realize a Fourrier transform spectroscopy experiment. A full comprehension of the measured linewidth requires a comparaison of the XRL beam amplification in the plasma to raytrace simulation. Results of transient pumping XRL simulations are presented in this article. The last section is dedicated to a description of the XUV Shack-Hartmann wavefront sensor we have developed, and to the study of the capillary discharge XRL beam.
| Original language | English |
|---|---|
| Pages (from-to) | 23-34 |
| Number of pages | 12 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 4505 |
| DOIs | |
| Publication status | Published - 1 Jan 2001 |
| Externally published | Yes |
Keywords
- 3D raytrace
- Capillary discharge X-ray laser
- Fourier Transform spectroscopy
- Michelson interferometer
- Transient pumping X-ray laser
- XUV wavefront sensor
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