Characterization methods dedicated to nanometer-thick hBN layers

Léonard Schué; Ingrid Stenger; Frédéric Fossard; Annick Loiseau; Julien Barjon

doi:10.1088/2053-1583/4/1/015028

Characterization methods dedicated to nanometer-thick hBN layers

Léonard Schué
, Ingrid Stenger
, Frédéric Fossard
, Annick Loiseau
, Julien Barjon

Research output: Contribution to journal › Article › peer-review

Abstract

Hexagonal boron nitride (hBN) has regained interest as a strategic component in graphene engineering and in van der Waals heterostructures built with two dimensional materials. It is crucial then, to handle reliable characterization techniques capable to assess the quality of structural and electronic properties of the hBN material used. We present here characterization procedures based on optical spectroscopies, namely cathodoluminescence and Raman, with the additional support of structural analysis conducted by transmission electron microscopy. We show the capability of optical spectroscopies to investigate and benchmark the optical and structural properties of various hBN thin layers sources.

Original language	English
Article number	015028
Journal	2D Materials
Volume	4
Issue number	1
DOIs	https://doi.org/10.1088/2053-1583/4/1/015028
Publication status	Published - 1 Mar 2017
Externally published	Yes

Keywords

Cathodoluminescence
Characterization
Raman
TEM
hBN

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10.1088/2053-1583/4/1/015028

Cite this

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title = "Characterization methods dedicated to nanometer-thick hBN layers",

abstract = "Hexagonal boron nitride (hBN) has regained interest as a strategic component in graphene engineering and in van der Waals heterostructures built with two dimensional materials. It is crucial then, to handle reliable characterization techniques capable to assess the quality of structural and electronic properties of the hBN material used. We present here characterization procedures based on optical spectroscopies, namely cathodoluminescence and Raman, with the additional support of structural analysis conducted by transmission electron microscopy. We show the capability of optical spectroscopies to investigate and benchmark the optical and structural properties of various hBN thin layers sources.",

keywords = "Cathodoluminescence, Characterization, Raman, TEM, hBN",

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AU - Schué, Léonard

AU - Stenger, Ingrid

AU - Fossard, Frédéric

AU - Loiseau, Annick

AU - Barjon, Julien

PY - 2017/3/1

Y1 - 2017/3/1

N2 - Hexagonal boron nitride (hBN) has regained interest as a strategic component in graphene engineering and in van der Waals heterostructures built with two dimensional materials. It is crucial then, to handle reliable characterization techniques capable to assess the quality of structural and electronic properties of the hBN material used. We present here characterization procedures based on optical spectroscopies, namely cathodoluminescence and Raman, with the additional support of structural analysis conducted by transmission electron microscopy. We show the capability of optical spectroscopies to investigate and benchmark the optical and structural properties of various hBN thin layers sources.

AB - Hexagonal boron nitride (hBN) has regained interest as a strategic component in graphene engineering and in van der Waals heterostructures built with two dimensional materials. It is crucial then, to handle reliable characterization techniques capable to assess the quality of structural and electronic properties of the hBN material used. We present here characterization procedures based on optical spectroscopies, namely cathodoluminescence and Raman, with the additional support of structural analysis conducted by transmission electron microscopy. We show the capability of optical spectroscopies to investigate and benchmark the optical and structural properties of various hBN thin layers sources.

KW - Cathodoluminescence

KW - Characterization

KW - Raman

KW - TEM

KW - hBN

UR - https://www.scopus.com/pages/publications/85014430366

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DO - 10.1088/2053-1583/4/1/015028

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SN - 2053-1583

VL - 4

JO - 2D Materials

JF - 2D Materials

IS - 1

M1 - 015028

ER -

Characterization methods dedicated to nanometer-thick hBN layers

Abstract

Keywords

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