Characterization of a loaded high impedance surface

Fabrice Linot; Xavier Begaud; Michel Soiron; Christian Renard; Michèle Labeyrie

doi:10.1017/S1759078709990596

Characterization of a loaded high impedance surface

Fabrice Linot
, Xavier Begaud
, Michel Soiron
, Christian Renard
, Michèle Labeyrie

CNRS LTCI
THALES Aerospace Division

Research output: Contribution to journal › Article › peer-review

Abstract

A high impedance surface (HIS) consisting of metallic square patches electrically connected one to each other with resistors is shown. Tunability of the absorption factor is achieved by the resistor value. The absorbing band of the loaded HIS is determined by the phase of the signal reflected by this structure. The main contribution of the paper is to demonstrate the absorption behavior over a wide range of incidence angle for both Transverse Electric (TE) and Transverse Magnetic (TM) polarizations. Using an equivalent circuit the resistor effect is investigated. It is shown that at resonance, the judicious choice of the resistor may lead to a significant absorption. The use of a waveguide simulator to characterize the performance of the loaded HIS is investigated. These methods have been used to design an ultra-thin absorber about λ_8.4GHz/35 thick.

Original language	English
Pages (from-to)	483-487
Number of pages	5
Journal	International Journal of Microwave and Wireless Technologies
Volume	1
Issue number	6
DOIs	https://doi.org/10.1017/S1759078709990596
Publication status	Published - 1 Dec 2009
Externally published	Yes

Keywords

High impedance surface (HIS)
Resistor
Salisbury screen
Ultra-thin radar absorbing material
Waveguide simulator

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10.1017/S1759078709990596

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title = "Characterization of a loaded high impedance surface",

abstract = "A high impedance surface (HIS) consisting of metallic square patches electrically connected one to each other with resistors is shown. Tunability of the absorption factor is achieved by the resistor value. The absorbing band of the loaded HIS is determined by the phase of the signal reflected by this structure. The main contribution of the paper is to demonstrate the absorption behavior over a wide range of incidence angle for both Transverse Electric (TE) and Transverse Magnetic (TM) polarizations. Using an equivalent circuit the resistor effect is investigated. It is shown that at resonance, the judicious choice of the resistor may lead to a significant absorption. The use of a waveguide simulator to characterize the performance of the loaded HIS is investigated. These methods have been used to design an ultra-thin absorber about λ8.4GHz/35 thick.",

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author = "Fabrice Linot and Xavier Begaud and Michel Soiron and Christian Renard and Mich{\`e}le Labeyrie",

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T1 - Characterization of a loaded high impedance surface

AU - Linot, Fabrice

AU - Begaud, Xavier

AU - Soiron, Michel

AU - Renard, Christian

AU - Labeyrie, Michèle

PY - 2009/12/1

Y1 - 2009/12/1

N2 - A high impedance surface (HIS) consisting of metallic square patches electrically connected one to each other with resistors is shown. Tunability of the absorption factor is achieved by the resistor value. The absorbing band of the loaded HIS is determined by the phase of the signal reflected by this structure. The main contribution of the paper is to demonstrate the absorption behavior over a wide range of incidence angle for both Transverse Electric (TE) and Transverse Magnetic (TM) polarizations. Using an equivalent circuit the resistor effect is investigated. It is shown that at resonance, the judicious choice of the resistor may lead to a significant absorption. The use of a waveguide simulator to characterize the performance of the loaded HIS is investigated. These methods have been used to design an ultra-thin absorber about λ8.4GHz/35 thick.

AB - A high impedance surface (HIS) consisting of metallic square patches electrically connected one to each other with resistors is shown. Tunability of the absorption factor is achieved by the resistor value. The absorbing band of the loaded HIS is determined by the phase of the signal reflected by this structure. The main contribution of the paper is to demonstrate the absorption behavior over a wide range of incidence angle for both Transverse Electric (TE) and Transverse Magnetic (TM) polarizations. Using an equivalent circuit the resistor effect is investigated. It is shown that at resonance, the judicious choice of the resistor may lead to a significant absorption. The use of a waveguide simulator to characterize the performance of the loaded HIS is investigated. These methods have been used to design an ultra-thin absorber about λ8.4GHz/35 thick.

KW - High impedance surface (HIS)

KW - Resistor

KW - Salisbury screen

KW - Ultra-thin radar absorbing material

KW - Waveguide simulator

U2 - 10.1017/S1759078709990596

DO - 10.1017/S1759078709990596

M3 - Article

AN - SCOPUS:78651569320

SN - 1759-0787

VL - 1

SP - 483

EP - 487

JO - International Journal of Microwave and Wireless Technologies

JF - International Journal of Microwave and Wireless Technologies

IS - 6

ER -

Characterization of a loaded high impedance surface

Abstract

Keywords

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