Charge-density analysis of GaS

  • A. Kuhn
  • , A. Bourdon
  • , J. Rigoult
  • , A. Rimsky

Research output: Contribution to journalArticlepeer-review

Abstract

The electron density in the AIIIBVI crystal GaS was experimentally determined by x-ray diffraction. The resulting density distribution varies markedly from the distribution predicted by the pseudopotential model proposed by Schlter et al. The real bonds observed in the x-ray diffraction determined distribution are curved and are located not only between Ga-Ga and Ga-S nearest neighbors as predicted by the pseudopotential model, but also between Ga and S next-nearest neighbors in the same elementary cell, between Ga and S atoms in adjoining elementary cells, and between S-S interlayer neighbors in the same elementary cell. The two atoms Ga and S are highly polarized. These findings allow a better understanding of the bondings and the discrepancies between our experimental findings, and the present pseudopotential model should permit an improvement in a future theoretical model for bonding in the AIIIBVI crystals.

Original languageEnglish
Pages (from-to)4081-4088
Number of pages8
JournalPhysical Review B
Volume25
Issue number6
DOIs
Publication statusPublished - 1 Jan 1982
Externally publishedYes

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