Cherenkov light-based beam profiling for ultrarelativistic electron beams

E. Adli; S. J. Gessner; S. Corde; M. J. Hogan; H. H. Bjerke

doi:10.1016/j.nima.2015.02.003

Cherenkov light-based beam profiling for ultrarelativistic electron beams

E. Adli
, S. J. Gessner
, S. Corde
, M. J. Hogan
, H. H. Bjerke

University of Oslo
Stanford Linear Accelerator Center
Norwegian University of Science and Technology

Research output: Contribution to journal › Article › peer-review

Abstract

Abstract We describe a beam profile monitor design based on Cherenkov light emitted from a charged particle beam in an air gap. The main components of the profile monitor are silicon wafers used to reflect Cherenkov light onto a camera lens system. The design allows for measuring large beam sizes, with large photon yield per beam charge and excellent signal linearity with beam charge. The profile monitor signal is independent of the particle energy for ultrarelativistic particles. Different design and parameter considerations are discussed. A Cherenkov light-based profile monitor has been installed at the FACET User Facility at SLAC. We report on the measured performance of this profile monitor.

Original language	English
Article number	57505
Pages (from-to)	35-42
Number of pages	8
Journal	Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume	783
DOIs	https://doi.org/10.1016/j.nima.2015.02.003
Publication status	Published - 1 Jan 2015
Externally published	Yes

Keywords

Cherenkov light
Electron beams
FACET User Facility
Profile monitor

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10.1016/j.nima.2015.02.003

Cite this

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title = "Cherenkov light-based beam profiling for ultrarelativistic electron beams",

abstract = "Abstract We describe a beam profile monitor design based on Cherenkov light emitted from a charged particle beam in an air gap. The main components of the profile monitor are silicon wafers used to reflect Cherenkov light onto a camera lens system. The design allows for measuring large beam sizes, with large photon yield per beam charge and excellent signal linearity with beam charge. The profile monitor signal is independent of the particle energy for ultrarelativistic particles. Different design and parameter considerations are discussed. A Cherenkov light-based profile monitor has been installed at the FACET User Facility at SLAC. We report on the measured performance of this profile monitor.",

keywords = "Cherenkov light, Electron beams, FACET User Facility, Profile monitor",

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year = "2015",

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doi = "10.1016/j.nima.2015.02.003",

language = "English",

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T1 - Cherenkov light-based beam profiling for ultrarelativistic electron beams

AU - Adli, E.

AU - Gessner, S. J.

AU - Corde, S.

AU - Hogan, M. J.

AU - Bjerke, H. H.

PY - 2015/1/1

Y1 - 2015/1/1

N2 - Abstract We describe a beam profile monitor design based on Cherenkov light emitted from a charged particle beam in an air gap. The main components of the profile monitor are silicon wafers used to reflect Cherenkov light onto a camera lens system. The design allows for measuring large beam sizes, with large photon yield per beam charge and excellent signal linearity with beam charge. The profile monitor signal is independent of the particle energy for ultrarelativistic particles. Different design and parameter considerations are discussed. A Cherenkov light-based profile monitor has been installed at the FACET User Facility at SLAC. We report on the measured performance of this profile monitor.

AB - Abstract We describe a beam profile monitor design based on Cherenkov light emitted from a charged particle beam in an air gap. The main components of the profile monitor are silicon wafers used to reflect Cherenkov light onto a camera lens system. The design allows for measuring large beam sizes, with large photon yield per beam charge and excellent signal linearity with beam charge. The profile monitor signal is independent of the particle energy for ultrarelativistic particles. Different design and parameter considerations are discussed. A Cherenkov light-based profile monitor has been installed at the FACET User Facility at SLAC. We report on the measured performance of this profile monitor.

KW - Cherenkov light

KW - Electron beams

KW - FACET User Facility

KW - Profile monitor

UR - https://www.scopus.com/pages/publications/84924272647

U2 - 10.1016/j.nima.2015.02.003

DO - 10.1016/j.nima.2015.02.003

M3 - Article

AN - SCOPUS:84924272647

SN - 0168-9002

VL - 783

SP - 35

EP - 42

JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

M1 - 57505

ER -

Cherenkov light-based beam profiling for ultrarelativistic electron beams

Abstract

Keywords

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