Cluster Tof-Sims imaging as a tool for micrometric histology of lipids in tissue

Claudia Bich; David Touboul; Alain Brunelle

doi:10.1002/mas.21399

Cluster Tof-Sims imaging as a tool for micrometric histology of lipids in tissue

Claudia Bich, David Touboul, Alain Brunelle

Centre national de la recherche scientifique

Research output: Contribution to journal › Article › peer-review

Abstract

Recent developments in instrumentation, ion beams or analyzers, for cluster time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging are described here. The methods which are employed to increase the sensitivity or to perform threedimensional analyses in the organic materials are also illustrated. This review shows the improvements made for lipid imaging by cluster TOF-SIMS in various types of material and applications, and gives reasons for the expansion of its utilization.

Original language	English
Pages (from-to)	442-451
Number of pages	10
Journal	Mass Spectrometry Reviews
Volume	33
Issue number	6
DOIs	https://doi.org/10.1002/mas.21399
Publication status	Published - 1 Nov 2014

Keywords

Clusters
Lipids
Mass spectrometry imaging
TOF-SIMS

Access to Document

10.1002/mas.21399

Cite this

@article{8f229dc117f6472c82004095ae1e1918,

title = "Cluster Tof-Sims imaging as a tool for micrometric histology of lipids in tissue",

abstract = "Recent developments in instrumentation, ion beams or analyzers, for cluster time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging are described here. The methods which are employed to increase the sensitivity or to perform threedimensional analyses in the organic materials are also illustrated. This review shows the improvements made for lipid imaging by cluster TOF-SIMS in various types of material and applications, and gives reasons for the expansion of its utilization.",

keywords = "Clusters, Lipids, Mass spectrometry imaging, TOF-SIMS",

author = "Claudia Bich and David Touboul and Alain Brunelle",

note = "Publisher Copyright: {\textcopyright} 2013 by Wiley Periodicals, Inc.",

year = "2014",

month = nov,

day = "1",

doi = "10.1002/mas.21399",

language = "English",

volume = "33",

pages = "442--451",

journal = "Mass Spectrometry Reviews",

issn = "0277-7037",

number = "6",

}

TY - JOUR

T1 - Cluster Tof-Sims imaging as a tool for micrometric histology of lipids in tissue

AU - Bich, Claudia

AU - Touboul, David

AU - Brunelle, Alain

PY - 2014/11/1

Y1 - 2014/11/1

N2 - Recent developments in instrumentation, ion beams or analyzers, for cluster time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging are described here. The methods which are employed to increase the sensitivity or to perform threedimensional analyses in the organic materials are also illustrated. This review shows the improvements made for lipid imaging by cluster TOF-SIMS in various types of material and applications, and gives reasons for the expansion of its utilization.

AB - Recent developments in instrumentation, ion beams or analyzers, for cluster time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging are described here. The methods which are employed to increase the sensitivity or to perform threedimensional analyses in the organic materials are also illustrated. This review shows the improvements made for lipid imaging by cluster TOF-SIMS in various types of material and applications, and gives reasons for the expansion of its utilization.

KW - Clusters

KW - Lipids

KW - Mass spectrometry imaging

KW - TOF-SIMS

U2 - 10.1002/mas.21399

DO - 10.1002/mas.21399

M3 - Article

C2 - 24265115

AN - SCOPUS:84908503383

SN - 0277-7037

VL - 33

SP - 442

EP - 451

JO - Mass Spectrometry Reviews

JF - Mass Spectrometry Reviews

IS - 6

ER -

Cluster Tof-Sims imaging as a tool for micrometric histology of lipids in tissue

Abstract

Keywords

Access to Document

Fingerprint

Cite this