Combining Laue microdiffraction and digital image correlation for improved measurements of the elastic strain field with micrometer spatial resolution

J. Petit; M. Bornert; F. Hofmann; O. Robach; J. S. Micha; O. Ulrich; C. Le Bourlot; D. Faurie; A. M. Korsunsky; O. Castelnau

doi:10.1016/j.piutam.2012.05.015

Combining Laue microdiffraction and digital image correlation for improved measurements of the elastic strain field with micrometer spatial resolution

J. Petit, M. Bornert, F. Hofmann, O. Robach, J. S. Micha, O. Ulrich, C. Le Bourlot, D. Faurie, A. M. Korsunsky, O. Castelnau

Research output: Contribution to journal › Conference article › peer-review

Abstract

The X-ray Laue microdiffraction technique, available at beamline BM32 on the synchrotron ESRF, is ideally suited for probing the field of elastic strain (and associated stress) in deformed polycrystalline materials with a micrometric spatial resolution. We show that using Digital Image Correlation for measuring Laue pattern distortions between two mechanical states improves significantly the estimate of elastic strain increment. The potentiality of this new Laue-DIC method is illustrated on an elastically bent Si single crystal, for which the measured elastic strain deviates not more than 10^-5 from the theoretical strain distribution provided by standard solutions.

Original language	English
Pages (from-to)	133-143
Number of pages	11
Journal	Procedia IUTAM
Volume	4
DOIs	https://doi.org/10.1016/j.piutam.2012.05.015
Publication status	Published - 1 Jan 2012
Externally published	Yes
Event	IUTAM Symposium on Full-Field Measurements and Identification in Solid Mechanics - Cachan, France Duration: 4 Jul 2011 → 8 Jul 2011

Keywords

Digital images correlation (DIC)
Four point bending
Microscopic analysis
Stress field
X-ray Laue microdiffraction

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10.1016/j.piutam.2012.05.015

Cite this

@article{344a8843c639491f99b5629eb3a5d2c5,

title = "Combining Laue microdiffraction and digital image correlation for improved measurements of the elastic strain field with micrometer spatial resolution",

abstract = "The X-ray Laue microdiffraction technique, available at beamline BM32 on the synchrotron ESRF, is ideally suited for probing the field of elastic strain (and associated stress) in deformed polycrystalline materials with a micrometric spatial resolution. We show that using Digital Image Correlation for measuring Laue pattern distortions between two mechanical states improves significantly the estimate of elastic strain increment. The potentiality of this new Laue-DIC method is illustrated on an elastically bent Si single crystal, for which the measured elastic strain deviates not more than 10-5 from the theoretical strain distribution provided by standard solutions.",

keywords = "Digital images correlation (DIC), Four point bending, Microscopic analysis, Stress field, X-ray Laue microdiffraction",

author = "J. Petit and M. Bornert and F. Hofmann and O. Robach and Micha, \{J. S.\} and O. Ulrich and \{Le Bourlot\}, C. and D. Faurie and Korsunsky, \{A. M.\} and O. Castelnau",

year = "2012",

month = jan,

day = "1",

doi = "10.1016/j.piutam.2012.05.015",

language = "English",

volume = "4",

pages = "133--143",

journal = "Procedia IUTAM",

issn = "2210-9838",

note = "IUTAM Symposium on Full-Field Measurements and Identification in Solid Mechanics ; Conference date: 04-07-2011 Through 08-07-2011",

}

TY - JOUR

T1 - Combining Laue microdiffraction and digital image correlation for improved measurements of the elastic strain field with micrometer spatial resolution

AU - Petit, J.

AU - Bornert, M.

AU - Hofmann, F.

AU - Robach, O.

AU - Micha, J. S.

AU - Ulrich, O.

AU - Le Bourlot, C.

AU - Faurie, D.

AU - Korsunsky, A. M.

AU - Castelnau, O.

PY - 2012/1/1

Y1 - 2012/1/1

N2 - The X-ray Laue microdiffraction technique, available at beamline BM32 on the synchrotron ESRF, is ideally suited for probing the field of elastic strain (and associated stress) in deformed polycrystalline materials with a micrometric spatial resolution. We show that using Digital Image Correlation for measuring Laue pattern distortions between two mechanical states improves significantly the estimate of elastic strain increment. The potentiality of this new Laue-DIC method is illustrated on an elastically bent Si single crystal, for which the measured elastic strain deviates not more than 10-5 from the theoretical strain distribution provided by standard solutions.

AB - The X-ray Laue microdiffraction technique, available at beamline BM32 on the synchrotron ESRF, is ideally suited for probing the field of elastic strain (and associated stress) in deformed polycrystalline materials with a micrometric spatial resolution. We show that using Digital Image Correlation for measuring Laue pattern distortions between two mechanical states improves significantly the estimate of elastic strain increment. The potentiality of this new Laue-DIC method is illustrated on an elastically bent Si single crystal, for which the measured elastic strain deviates not more than 10-5 from the theoretical strain distribution provided by standard solutions.

KW - Digital images correlation (DIC)

KW - Four point bending

KW - Microscopic analysis

KW - Stress field

KW - X-ray Laue microdiffraction

UR - https://www.scopus.com/pages/publications/84867480941

U2 - 10.1016/j.piutam.2012.05.015

DO - 10.1016/j.piutam.2012.05.015

M3 - Conference article

AN - SCOPUS:84867480941

SN - 2210-9838

VL - 4

SP - 133

EP - 143

JO - Procedia IUTAM

JF - Procedia IUTAM

T2 - IUTAM Symposium on Full-Field Measurements and Identification in Solid Mechanics

Y2 - 4 July 2011 through 8 July 2011

ER -

Combining Laue microdiffraction and digital image correlation for improved measurements of the elastic strain field with micrometer spatial resolution

Abstract

Keywords

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