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Competitive and synergistic effects between excimer VUV radiation and O radicals on the etching mechanisms of polyethylene and fluoropolymer surfaces treated by an atmospheric He-O2 post-discharge

  • T. Dufour
  • , J. Hubert
  • , N. Vandencasteele
  • , P. Viville
  • , R. Lazzaroni
  • , F. Reniers
  • Université Libre de Bruxelles
  • Université de Mons

Research output: Contribution to journalArticlepeer-review

23 Citations (Scopus)

Abstract

Among various surface modification techniques, plasma can be used as a source for tailoring the surface properties of diverse materials. HDPE and fluoropolymer surfaces have been treated by the post-discharge of an atmospheric RF-plasma torch supplied with helium and oxygen gases. The plasma-treated surfaces were characterized by measurements of mass losses, water contact angles, x-ray photoelectron spectroscopy and atomic force microscopy. This experimental approach correlated with an optical characterization of the plasma phase allowed us to propose etching mechanisms occurring at the post-discharge/polymer interface. We discuss how competitive and synergistic effects can result from the oxidation and/or the roughening of the surface but also from the excimer VUV radiation, the He metastable species and the O radicals reaching the plasma-polymer interface.

Original languageEnglish
Article number315203
JournalJournal of Physics D: Applied Physics
Volume46
Issue number31
DOIs
Publication statusPublished - 7 Aug 2013
Externally publishedYes

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