Abstract
A High brightness crystal spectograph was developed to analyze the x-ray K α spectrum of aluminum. It was observed that high image brightness was obtained through strong spatial focusing along with spectral resolution greater than 500. It was also observed that the emission spot size could be estimated from the spatial linewidth in the spectrum. The results show that the absolute Kα yield allows to infer the total number of incident electrons.
| Original language | English |
|---|---|
| Pages (from-to) | 2024-2028 |
| Number of pages | 5 |
| Journal | Review of Scientific Instruments |
| Volume | 75 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 1 Jun 2004 |
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