Skip to main navigation Skip to search Skip to main content

Contour shape analysis of hollow ion x-ray emission

  • Sorbonne Université

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Hollow ion x-ray transitions originating from the configurations K 0LN have been studied via relativistic atomic structure and Stark broadening calculations. The broadening of the total contour is largely influenced by the oscillator strengths distribution over wavelengths rather than by Stark broadening alone. Interference effects between the upper and lower levels are shown to result in a considerable contour narrowing as well as in a shift of the total contour which could be either red or blue.

Original languageEnglish
Title of host publicationSpectral Line Shapes - Volume 15 - 19th International Conference on Spectral Line Shapes
Pages349-354
Number of pages6
DOIs
Publication statusPublished - 10 Dec 2008
Event19th International Conference on Spectral Line Shapes - Valladolid, Spain
Duration: 15 Jun 200820 Jun 2008

Publication series

NameAIP Conference Proceedings
Volume1058
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

Conference19th International Conference on Spectral Line Shapes
Country/TerritorySpain
CityValladolid
Period15/06/0820/06/08

Keywords

  • Contour shapes
  • Hollow ions
  • Laser produced plasmas
  • Stark broadening
  • X-ray spectroscopy

Fingerprint

Dive into the research topics of 'Contour shape analysis of hollow ion x-ray emission'. Together they form a unique fingerprint.

Cite this