TY - GEN
T1 - Convolution blocks based on self-checking operators
AU - Franco, Denis Teixeira
AU - Naviner, Jean François
AU - Naviner, Lirida Alves De Barros
PY - 2007/12/1
Y1 - 2007/12/1
N2 - The arrival of CMOS integrated systems into nanoscale dimensions is presenting many challenges to designers and manufacturers concerning yield and reliability of integrated circuits. Traditional techniques to cope with these subjects are not as effective as they were before and many solutions are considered to allow CMOS evolution to continue according to Moore's law. Among the proposed solutions in the literature there's self-checking design and circuit reconfiguration. In the present work we introduce self-checking arithmetic operators in the design of convolution processors and we verify the penalties of such solutions in terms of area and speed. The self-checking methods considered are parity prediction, duplication and 1-out-of-3 encoding.
AB - The arrival of CMOS integrated systems into nanoscale dimensions is presenting many challenges to designers and manufacturers concerning yield and reliability of integrated circuits. Traditional techniques to cope with these subjects are not as effective as they were before and many solutions are considered to allow CMOS evolution to continue according to Moore's law. Among the proposed solutions in the literature there's self-checking design and circuit reconfiguration. In the present work we introduce self-checking arithmetic operators in the design of convolution processors and we verify the penalties of such solutions in terms of area and speed. The self-checking methods considered are parity prediction, duplication and 1-out-of-3 encoding.
KW - CED
KW - Convolution
KW - Parity checking
KW - Parity prediction
KW - Reliability
KW - Self-checking
KW - Signed digit representation
UR - https://www.scopus.com/pages/publications/47749155718
U2 - 10.1109/MIXDES.2007.4286211
DO - 10.1109/MIXDES.2007.4286211
M3 - Conference contribution
AN - SCOPUS:47749155718
SN - 8392263243
SN - 9788392263241
T3 - Proceedings of the 14th International Conference "Mixed Design of Integrated Circuits and Systems", MIXDES 2007
SP - 487
EP - 491
BT - Proceedings of the 14th International Conference "Mixed Design of Integrated Circuits and Systems", MIXDES 2007
T2 - 14th International Conference "Mixed Design of Integrated Circuits and Systems", MIXDES 2007
Y2 - 21 June 2007 through 23 June 2007
ER -