TY - JOUR
T1 - Creation of glass-characteristic point defects in crystalline SiO2 by 2.5 MeV electrons and by fast neutrons
AU - Skuja, Linards
AU - Ollier, Nadège
AU - Kajihara, Koichi
AU - Smits, Krisjanis
N1 - Publisher Copyright:
© 2018 Elsevier B.V.
PY - 2019/2/1
Y1 - 2019/2/1
N2 - Point defects in crystalline SiO2, created by 2.5 MeV electron irradiation at dose below the amorphization threshold or by fast neutrons, were compared by luminescence spectroscopy. Oxygen dangling bonds (“non-bridging oxygen hole centers”, NBOHCs), peculiar to amorphous state of SiO2, were detected for the first time in electron-irradiated non-amorphized α-quartz crystal. Their presence may signal the formation of nucleation centers in crystal structure as the first step to radiation-induced amorphization. Compared to crystal, irradiated by 1019 cm−2 fast neutrons, their concentration was over 100 times lower, and their inhomogeneous broadening was at least 2.5 times smaller. Divalent silicons (“silicon oxygen deficiency centers”, SiODC(II)), inherent to oxygen-deficient or irradiated SiO2 glass, were detected in neutron-irradiated (1019 n/cm2) α-quartz but were not found after the electron irradiation. Radiation-induced interstitial O2 molecules, characteristic to irradiated glassy SiO2 and other oxide glasses, are found in α-quartz only after neutron irradiation. The oxygen atoms, displaced by the 2.5 MeV e− irradiation of α-quartz for fluences up to 1019 e−/cm2 evidently stays entirely in the peroxy linkage (Si-O-O-Si bond) form.
AB - Point defects in crystalline SiO2, created by 2.5 MeV electron irradiation at dose below the amorphization threshold or by fast neutrons, were compared by luminescence spectroscopy. Oxygen dangling bonds (“non-bridging oxygen hole centers”, NBOHCs), peculiar to amorphous state of SiO2, were detected for the first time in electron-irradiated non-amorphized α-quartz crystal. Their presence may signal the formation of nucleation centers in crystal structure as the first step to radiation-induced amorphization. Compared to crystal, irradiated by 1019 cm−2 fast neutrons, their concentration was over 100 times lower, and their inhomogeneous broadening was at least 2.5 times smaller. Divalent silicons (“silicon oxygen deficiency centers”, SiODC(II)), inherent to oxygen-deficient or irradiated SiO2 glass, were detected in neutron-irradiated (1019 n/cm2) α-quartz but were not found after the electron irradiation. Radiation-induced interstitial O2 molecules, characteristic to irradiated glassy SiO2 and other oxide glasses, are found in α-quartz only after neutron irradiation. The oxygen atoms, displaced by the 2.5 MeV e− irradiation of α-quartz for fluences up to 1019 e−/cm2 evidently stays entirely in the peroxy linkage (Si-O-O-Si bond) form.
KW - Amorphization
KW - Dangling bonds
KW - Electron irradiation
KW - Luminescence
KW - Quartz
KW - Silica glass
U2 - 10.1016/j.jnoncrysol.2018.11.014
DO - 10.1016/j.jnoncrysol.2018.11.014
M3 - Article
AN - SCOPUS:85057050215
SN - 0022-3093
VL - 505
SP - 252
EP - 259
JO - Journal of Non-Crystalline Solids
JF - Journal of Non-Crystalline Solids
ER -