Crystalline silicon solar cells with doped epitaxial silicon films obtained at low-temperature by PECVD

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In spite of dramatic improvements in thin film technologies, crystalline silicon (c-Si) solar cells are still leading the photovoltaic market thanks to continuous progress. In this field, one innovative way is the development of thin silicon epitaxial films (epi-Si) on (100) c-Si wafers to fabricate the emitter and/or back surface field of solar cells. Among the possible techniques, we used radio-frequency plasma enhanced chemical vapor deposition (rf-PECVD) for it is a low thermal budget, scalable, wide-spread process in photovoltaics and it is well-suited to make solar cells on thin c-Si wafers (< 150 μm) without too much stress induced. In this paper, we report the obtaining of n-type epi-Si layers and p-type epi-Si layers by adding a proper amount of phosphine (PH3), diborane (B2H6) or trimethylboron (TMB) to the gas phase as well as appropriately adjusting the deposition temperature, pressure and silane gas flow. For n-type epi-Si layers, we managed to obtain degenerate levels of doping while maintaining the epitaxial growth quality of Si films whereas for p-type we obtained highly doped epi-Si lalers with hole concentration spreading from 2.1018 cm-3 to 6.1019 cm-3 (at 300 K). Another noticeable result is that the deposition temperature dependence of the boron-doped epi-Si films changes according to the doping gas used (TMB or B2H6). This behavior has to be opposed to intrinsic epi-Si for which the higher the temperature the better the epitaxy. We also pay a particular attention to reproducibility of doping levels for n-type and p-type epi-Si layers. Finally, we fabricated c-Si solar cells with p-type epi-Si emitter (entirely epitaxial) and a-Si:H back contact (intrinsic and n-type). In this work we compare our previous results based on laser-cutting and screen-printing for which we achieved an efficiency of 14.2 % [1] with a new fully in-house process in which only SF6 etching is used to define the solar cells and evaporated silver contacts are used for the front grid leading to a solar cell efficiency of 13.4 %.

Original languageEnglish
Title of host publicationProgram - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010
Pages1352-1357
Number of pages6
DOIs
Publication statusPublished - 20 Dec 2010
Event35th IEEE Photovoltaic Specialists Conference, PVSC 2010 - Honolulu, HI, United States
Duration: 20 Jun 201025 Jun 2010

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371

Conference

Conference35th IEEE Photovoltaic Specialists Conference, PVSC 2010
Country/TerritoryUnited States
CityHonolulu, HI
Period20/06/1025/06/10

Fingerprint

Dive into the research topics of 'Crystalline silicon solar cells with doped epitaxial silicon films obtained at low-temperature by PECVD'. Together they form a unique fingerprint.

Cite this