Abstract
The crystallization kinetics of hydrogenated amorphous silicon thick films grown by plasma-enhanced chemical vapour deposition is studied by differential scanning and isothermal calorimetry in a wide temperature range varying from 600 to 720°C. The reported kinetics is found to correspond to three-dimensional growth. The kinetic parameters obtained are in good agreement with those already published on thin films.
| Original language | English |
|---|---|
| Pages (from-to) | 165-168 |
| Number of pages | 4 |
| Journal | Applied Surface Science |
| Volume | 238 |
| Issue number | 1-4 SPEC. ISS. |
| DOIs | |
| Publication status | Published - 15 Nov 2004 |
| Event | APHYS 2003 - Badajoz, Spain Duration: 13 Oct 2003 → 18 Oct 2003 |
Keywords
- Amorphous silicon
- Crystallization kinetics
- DSC