Crystallization kinetics of hydrogenated amorphous silicon thick films grown by plasma-enhanced chemical vapour deposition

J. Farjas, Chandana Rath, P. Roura, P. Roca I Cabarrocas

Research output: Contribution to journalConference articlepeer-review

Abstract

The crystallization kinetics of hydrogenated amorphous silicon thick films grown by plasma-enhanced chemical vapour deposition is studied by differential scanning and isothermal calorimetry in a wide temperature range varying from 600 to 720°C. The reported kinetics is found to correspond to three-dimensional growth. The kinetic parameters obtained are in good agreement with those already published on thin films.

Original languageEnglish
Pages (from-to)165-168
Number of pages4
JournalApplied Surface Science
Volume238
Issue number1-4 SPEC. ISS.
DOIs
Publication statusPublished - 15 Nov 2004
EventAPHYS 2003 - Badajoz, Spain
Duration: 13 Oct 200318 Oct 2003

Keywords

  • Amorphous silicon
  • Crystallization kinetics
  • DSC

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