Data acquisition test platform for non uniformly controlled ADC

Asma Maalej; Ben Romdhane Manel; Patricia Desgreys; Patrick Loumeau; Chiheb Rebai; Adel Ghazel

doi:10.1109/DTIS.2010.5487563

Data acquisition test platform for non uniformly controlled ADC

Asma Maalej
, Ben Romdhane Manel
, Patricia Desgreys
, Patrick Loumeau
, Chiheb Rebai
, Adel Ghazel

University of Carthage, Ecole Supérieure des Communications de Tunis
CNRS LTCI

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

5 Citations (Scopus)

Abstract

Non Uniform Sampling (NUS) was presented as an emerging solution to reduce aliases for ADC (Analog-to-Digital Converter) in Software Defined Radio receiver. In this paper, practical implementations of NUS, called TQ-RS (Time Quantized Random Sampling) are presented. A test setup for non uniformly controlled data acquisition system is detailed. Experimental results are presented and discussed.

Original language	English
Title of host publication	5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2010
DOIs	https://doi.org/10.1109/DTIS.2010.5487563
Publication status	Published - 20 Oct 2010
Externally published	Yes
Event	5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2010 - Hammamet, Tunisia Duration: 23 Mar 2010 → 25 Mar 2010

Publication series

Name	5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2010

Conference

Conference	5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2010
Country/Territory	Tunisia
City	Hammamet
Period	23/03/10 → 25/03/10

Keywords

Non uniform sampling
Test platform

Access to Document

10.1109/DTIS.2010.5487563

Cite this

Maalej, A., Manel, B. R., Desgreys, P., Loumeau, P., Rebai, C., & Ghazel, A. (2010). Data acquisition test platform for non uniformly controlled ADC. In 5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2010 Article 5487563 (5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2010). https://doi.org/10.1109/DTIS.2010.5487563

@inproceedings{deff1d64de4a4e4e9b66212d1a4195c4,

title = "Data acquisition test platform for non uniformly controlled ADC",

abstract = "Non Uniform Sampling (NUS) was presented as an emerging solution to reduce aliases for ADC (Analog-to-Digital Converter) in Software Defined Radio receiver. In this paper, practical implementations of NUS, called TQ-RS (Time Quantized Random Sampling) are presented. A test setup for non uniformly controlled data acquisition system is detailed. Experimental results are presented and discussed.",

keywords = "Non uniform sampling, Test platform",

author = "Asma Maalej and Manel, \{Ben Romdhane\} and Patricia Desgreys and Patrick Loumeau and Chiheb Rebai and Adel Ghazel",

year = "2010",

month = oct,

day = "20",

doi = "10.1109/DTIS.2010.5487563",

language = "English",

isbn = "9781424463404",

series = "5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2010",

booktitle = "5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2010",

note = "5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2010 ; Conference date: 23-03-2010 Through 25-03-2010",

}

Maalej, A, Manel, BR, Desgreys, P, Loumeau, P, Rebai, C & Ghazel, A 2010, Data acquisition test platform for non uniformly controlled ADC. in 5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2010., 5487563, 5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2010, 5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2010, Hammamet, Tunisia, 23/03/10. https://doi.org/10.1109/DTIS.2010.5487563

Data acquisition test platform for non uniformly controlled ADC. / Maalej, Asma; Manel, Ben Romdhane; Desgreys, Patricia et al.
5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2010. 2010. 5487563 (5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2010).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Data acquisition test platform for non uniformly controlled ADC

AU - Maalej, Asma

AU - Manel, Ben Romdhane

AU - Desgreys, Patricia

AU - Loumeau, Patrick

AU - Rebai, Chiheb

AU - Ghazel, Adel

PY - 2010/10/20

Y1 - 2010/10/20

N2 - Non Uniform Sampling (NUS) was presented as an emerging solution to reduce aliases for ADC (Analog-to-Digital Converter) in Software Defined Radio receiver. In this paper, practical implementations of NUS, called TQ-RS (Time Quantized Random Sampling) are presented. A test setup for non uniformly controlled data acquisition system is detailed. Experimental results are presented and discussed.

AB - Non Uniform Sampling (NUS) was presented as an emerging solution to reduce aliases for ADC (Analog-to-Digital Converter) in Software Defined Radio receiver. In this paper, practical implementations of NUS, called TQ-RS (Time Quantized Random Sampling) are presented. A test setup for non uniformly controlled data acquisition system is detailed. Experimental results are presented and discussed.

KW - Non uniform sampling

KW - Test platform

U2 - 10.1109/DTIS.2010.5487563

DO - 10.1109/DTIS.2010.5487563

M3 - Conference contribution

AN - SCOPUS:77957889413

SN - 9781424463404

T3 - 5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2010

BT - 5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2010

T2 - 5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2010

Y2 - 23 March 2010 through 25 March 2010

ER -

Data acquisition test platform for non uniformly controlled ADC

Abstract

Publication series

Conference

Keywords

Access to Document

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Cite this