TY - GEN
T1 - Deep Surface Reconstruction from Point Clouds with Visibility Information
AU - Sulzer, Raphael
AU - Landrieu, Loic
AU - Boulch, Alexandre
AU - Marlet, Renaud
AU - Vallet, Bruno
N1 - Publisher Copyright:
© 2022 IEEE.
PY - 2022/1/1
Y1 - 2022/1/1
N2 - Most current neural networks for reconstructing surfaces from point clouds ignore sensor poses and only operate on point locations. Sensor visibility, however, holds meaningful information regarding space occupancy and surface orientation. In this paper, we present two simple ways to augment point clouds with visibility information, so it can directly be leveraged by surface reconstruction networks with minimal adaptation. Our proposed modifications consistently improve the accuracy of generated surfaces as well as the generalization capability of the networks to unseen domains. Our code, data and pretrained models can be found online: https://github.com/raphaelsulzer/dsrv-data.
AB - Most current neural networks for reconstructing surfaces from point clouds ignore sensor poses and only operate on point locations. Sensor visibility, however, holds meaningful information regarding space occupancy and surface orientation. In this paper, we present two simple ways to augment point clouds with visibility information, so it can directly be leveraged by surface reconstruction networks with minimal adaptation. Our proposed modifications consistently improve the accuracy of generated surfaces as well as the generalization capability of the networks to unseen domains. Our code, data and pretrained models can be found online: https://github.com/raphaelsulzer/dsrv-data.
UR - https://www.scopus.com/pages/publications/85143605763
U2 - 10.1109/ICPR56361.2022.9956560
DO - 10.1109/ICPR56361.2022.9956560
M3 - Conference contribution
AN - SCOPUS:85143605763
T3 - Proceedings - International Conference on Pattern Recognition
SP - 2415
EP - 2422
BT - 2022 26th International Conference on Pattern Recognition, ICPR 2022
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 26th International Conference on Pattern Recognition, ICPR 2022
Y2 - 21 August 2022 through 25 August 2022
ER -