Abstract
The degradation of InGaAsN p-i-n subcell under 1-MeV electron irradiation was studied by characterizing solar cells and dilute nitride bulk layers before and after irradiation. Cells are measured to retain more than 94% of their original photocurrent after 1015 cm-2, 1-MeV electron irradiation. Moreover, no significant degradation of the optoelectronic properties is observed after irradiation.
| Original language | English |
|---|---|
| Article number | 9383017 |
| Pages (from-to) | 1694-1700 |
| Number of pages | 7 |
| Journal | IEEE Transactions on Nuclear Science |
| Volume | 68 |
| Issue number | 8 |
| DOIs | |
| Publication status | Published - 1 Aug 2021 |
| Externally published | Yes |
Keywords
- Deep-level transient spectroscopy (DLTS)
- InGaAsN
- degradation
- dilute nitrides
- electrons
- external quantum efficiency (EQE)
- irradiation
- multijunction solar cell (MJSC)
- photoluminescence (PL)
- solar cell
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