| Original language | English |
|---|---|
| Pages (from-to) | 17-25 |
| Number of pages | 9 |
| Journal | IEEE Design and Test |
| Volume | 40 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 1 Jun 2023 |
Dependable STT-MRAM With Emerging Approximation and Speculation Paradigms
- Hao Cai
- , Yaoru Hou
- , Mengdi Zhang
- , Bo Liu
- , Lirida Alves De Barros Naviner
Research output: Contribution to journal › Article › peer-review