Design and measurement of a thin and light absorbing material for space applications

Yenny Pinto; Julien Sarrazin; Anne Claire Lepage; Xavier Begaud; Nicolas Capet

doi:10.1007/s00339-013-8097-1

Design and measurement of a thin and light absorbing material for space applications

Yenny Pinto, Julien Sarrazin, Anne Claire Lepage, Xavier Begaud, Nicolas Capet

Research output: Contribution to journal › Article › peer-review

Abstract

This paper presents the design, realization and measurement of a thin lightweight absorbing material for space applications. Absorber design is based on high impedance surfaces loaded with resistors and known as a resistive high impedance surface (RHIS). The behavior of RHIS is analyzed at normal and oblique incidences for TE and TM polarizations. Prototypes have been realized and measured. Final design has a reflection coefficient less than - 15 dB in S-Band (2-2.3 GHz) at normal incidence and till an angular dispersion of 40° for waves in TE polarization, and 35 ° for waves in TM polarization. Simulation results are validated by measurement.

Original language	English
Pages (from-to)	541-545
Number of pages	5
Journal	Applied Physics A: Materials Science and Processing
Volume	115
Issue number	2
DOIs	https://doi.org/10.1007/s00339-013-8097-1
Publication status	Published - 1 Jan 2014
Externally published	Yes

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@article{3bf0229fa0b847a1b76337749126b305,

title = "Design and measurement of a thin and light absorbing material for space applications",

abstract = "This paper presents the design, realization and measurement of a thin lightweight absorbing material for space applications. Absorber design is based on high impedance surfaces loaded with resistors and known as a resistive high impedance surface (RHIS). The behavior of RHIS is analyzed at normal and oblique incidences for TE and TM polarizations. Prototypes have been realized and measured. Final design has a reflection coefficient less than - 15 dB in S-Band (2-2.3 GHz) at normal incidence and till an angular dispersion of 40° for waves in TE polarization, and 35 ° for waves in TM polarization. Simulation results are validated by measurement.",

author = "Yenny Pinto and Julien Sarrazin and Lepage, \{Anne Claire\} and Xavier Begaud and Nicolas Capet",

year = "2014",

month = jan,

day = "1",

doi = "10.1007/s00339-013-8097-1",

language = "English",

volume = "115",

pages = "541--545",

journal = "Applied Physics A: Materials Science and Processing",

issn = "0947-8396",

number = "2",

}

TY - JOUR

T1 - Design and measurement of a thin and light absorbing material for space applications

AU - Pinto, Yenny

AU - Sarrazin, Julien

AU - Lepage, Anne Claire

AU - Begaud, Xavier

AU - Capet, Nicolas

PY - 2014/1/1

Y1 - 2014/1/1

N2 - This paper presents the design, realization and measurement of a thin lightweight absorbing material for space applications. Absorber design is based on high impedance surfaces loaded with resistors and known as a resistive high impedance surface (RHIS). The behavior of RHIS is analyzed at normal and oblique incidences for TE and TM polarizations. Prototypes have been realized and measured. Final design has a reflection coefficient less than - 15 dB in S-Band (2-2.3 GHz) at normal incidence and till an angular dispersion of 40° for waves in TE polarization, and 35 ° for waves in TM polarization. Simulation results are validated by measurement.

AB - This paper presents the design, realization and measurement of a thin lightweight absorbing material for space applications. Absorber design is based on high impedance surfaces loaded with resistors and known as a resistive high impedance surface (RHIS). The behavior of RHIS is analyzed at normal and oblique incidences for TE and TM polarizations. Prototypes have been realized and measured. Final design has a reflection coefficient less than - 15 dB in S-Band (2-2.3 GHz) at normal incidence and till an angular dispersion of 40° for waves in TE polarization, and 35 ° for waves in TM polarization. Simulation results are validated by measurement.

U2 - 10.1007/s00339-013-8097-1

DO - 10.1007/s00339-013-8097-1

M3 - Article

AN - SCOPUS:84901198691

SN - 0947-8396

VL - 115

SP - 541

EP - 545

JO - Applied Physics A: Materials Science and Processing

JF - Applied Physics A: Materials Science and Processing

IS - 2

ER -

Design and measurement of a thin and light absorbing material for space applications

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