Abstract
This talk describes the high potential of optical low-coherence reflectometry (OLCR) and its upgraded in-situ facilities to assess the fabrication techniques of InP-based photonic circuits and also to help to optimize the design and further evaluate the performance of several key components (butt-joints, bend guides, MMI couplers, EAMs, DBR lasers, etc.,).
| Original language | English |
|---|---|
| Pages (from-to) | 544-545 |
| Number of pages | 2 |
| Journal | Conference Proceedings-International Conference on Indium Phosphide and Related Materials |
| Publication status | Published - 25 Jul 2003 |
| Event | 2003 International Conference Indium Phosphide and Related Materials - Santa Barbara, CA, United States Duration: 12 May 2003 → 16 May 2003 |