TY - GEN
T1 - Determination of the reference impedance of Line-Attenuator-Reflect for on-wafer vector network analyzer calibration
AU - Bahouche, Mebrouk
AU - Bergeault, Eric
AU - Allal, Djamel
PY - 2009/11/25
Y1 - 2009/11/25
N2 - A determination of the reference impedance for the three standards Line-Attenuator-Reflect (LAR) on-wafer vector network-analyzer (VNA) calibration is proposed. As a result, it is shown that the reference impedance to which the LAR calibration is referred cannot generally be determined. Based on this consideration, a modified LAR calibration allows a precise determination of the reference impedance so that the calibration accuracy is improved. Measurement results, compared to those obtained using the conventional multiline TRL calibration, show the efficiency of the proposed method up to 45 GHz.
AB - A determination of the reference impedance for the three standards Line-Attenuator-Reflect (LAR) on-wafer vector network-analyzer (VNA) calibration is proposed. As a result, it is shown that the reference impedance to which the LAR calibration is referred cannot generally be determined. Based on this consideration, a modified LAR calibration allows a precise determination of the reference impedance so that the calibration accuracy is improved. Measurement results, compared to those obtained using the conventional multiline TRL calibration, show the efficiency of the proposed method up to 45 GHz.
KW - Calibration
KW - Reference impedance
KW - Scattering parameters
KW - Standards
UR - https://www.scopus.com/pages/publications/70449858904
U2 - 10.1109/IMTC.2009.5168529
DO - 10.1109/IMTC.2009.5168529
M3 - Conference contribution
AN - SCOPUS:70449858904
SN - 9781424433537
T3 - 2009 IEEE Intrumentation and Measurement Technology Conference, I2MTC 2009
SP - 642
EP - 645
BT - 2009 IEEE Intrumentation and Measurement Technology Conference, I2MTC 2009
T2 - 2009 IEEE Intrumentation and Measurement Technology Conference, I2MTC 2009
Y2 - 5 May 2009 through 7 May 2009
ER -