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Development of XUV laser applications at LSAI-LULI

  • Gerard Jamelot
  • , F. Albert
  • , Alexander B. Belsky
  • , Mustapha Boussoukaya
  • , Antoine Carillon
  • , Andre Egbert
  • , S. Hubert
  • , Pierre Jaeglé
  • , Denis Joyeux
  • , I. Kamenskikh
  • , Annie Klisnick
  • , S. Meyer
  • , Daniel Phalippou
  • , David Ros
  • , Bedrich Rus
  • , Stephane Sebban
  • , Bernd Wellegehausen
  • , T. Woyvod
  • , Philippe Zeitoun
  • , Anne Zeitoun-Fakiris
  • Laboratoire de Spectroscopie Atomique et Ionique (LSAI)
  • Université Paris-Saclay
  • Synchrotron Radiation Laboratory
  • Moscow State University
  • IGFL, Université de Lyon, Université Lyon 1
  • Institut Pierre Simon Laplace, CNRS and CEA
  • Institut für Quantenoptik (IQO)
  • Leibniz Universität Hannover, Institut für Quantenoptik
  • Université Paris-Sud
  • Department of Gas Lasers
  • Institute of Physics of the Czech Academy of Sciences

Research output: Contribution to journal › Conference article › peer-review

1 Citation (Scopus)

Abstract

Collisional X-UV lasers are now currently produced world-wide. The LSAI team has developed at LULI an efficient, high brightness laser at 21.2 nm, using neonlike zinc. Beside the effort aimed at improvement of efficiency of the neonlike X-UV lasers, the LSAI recent activity has covered scaling the collisional scheme down to shorter wavelengths, as well as development of applications. In this paper we present results of applications of the 21.2 nm laser in atomic physics, solid state physics, and X-UV interferometry of surfaces. The emphasized message is that the characteristics of the existing X-UV lasers render possible applications in many research areas nowadays.

Original languageEnglish
Pages (from-to)124-134
Number of pages11
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3156
DOIs
Publication statusPublished - 1 Dec 1997
Externally publishedYes
EventSoft X-Ray Lasers and Applications II - San Diego, CA, United States
Duration: 28 Jul 1997 → 28 Jul 1997

Keywords

  • Innershell photoionisation
  • Photoluminescence
  • Surface analysis
  • X-UV interferometry
  • X-ray lasers

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