Diffusing-wave spectroscopy contribution to strain analysis

M. Erpelding; B. Dollet; A. Faisant; J. Crassous; A. Amon

doi:10.1111/str.12024

Diffusing-wave spectroscopy contribution to strain analysis

M. Erpelding, B. Dollet, A. Faisant, J. Crassous, A. Amon

IPR (Institut de Physique de Rennes) - UMR 6251

Research output: Contribution to journal › Article › peer-review

Abstract

We present a new full-field strain measurement method based on diffusing-wave spectroscopy. Our technique makes it possible to measure strains in the vicinity of the surface of highly light-scattering materials. Its main feature is an extreme sensitivity: the range of deformations measured is 10 ^-5-10^-3. To validate the measurements, experimental results from several plane stress configurations are compared with theoretical and numerical calculations. Furthermore, we propose an extension of the method for non-scattering materials.

Original language	English
Pages (from-to)	167-174
Number of pages	8
Journal	Strain
Volume	49
Issue number	2
DOIs	https://doi.org/10.1111/str.12024
Publication status	Published - 1 Apr 2013
Externally published	Yes

Keywords

diffusing-wave spectroscopy
full-field strain measurements
speckle interferometry

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10.1111/str.12024

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abstract = "We present a new full-field strain measurement method based on diffusing-wave spectroscopy. Our technique makes it possible to measure strains in the vicinity of the surface of highly light-scattering materials. Its main feature is an extreme sensitivity: the range of deformations measured is 10 -5-10-3. To validate the measurements, experimental results from several plane stress configurations are compared with theoretical and numerical calculations. Furthermore, we propose an extension of the method for non-scattering materials.",

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AU - Erpelding, M.

AU - Dollet, B.

AU - Faisant, A.

AU - Crassous, J.

AU - Amon, A.

PY - 2013/4/1

Y1 - 2013/4/1

N2 - We present a new full-field strain measurement method based on diffusing-wave spectroscopy. Our technique makes it possible to measure strains in the vicinity of the surface of highly light-scattering materials. Its main feature is an extreme sensitivity: the range of deformations measured is 10 -5-10-3. To validate the measurements, experimental results from several plane stress configurations are compared with theoretical and numerical calculations. Furthermore, we propose an extension of the method for non-scattering materials.

AB - We present a new full-field strain measurement method based on diffusing-wave spectroscopy. Our technique makes it possible to measure strains in the vicinity of the surface of highly light-scattering materials. Its main feature is an extreme sensitivity: the range of deformations measured is 10 -5-10-3. To validate the measurements, experimental results from several plane stress configurations are compared with theoretical and numerical calculations. Furthermore, we propose an extension of the method for non-scattering materials.

KW - diffusing-wave spectroscopy

KW - full-field strain measurements

KW - speckle interferometry

U2 - 10.1111/str.12024

DO - 10.1111/str.12024

M3 - Article

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VL - 49

SP - 167

EP - 174

JO - Strain

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Diffusing-wave spectroscopy contribution to strain analysis

Abstract

Keywords

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