Direct evidence for trivalent titanium in artificially irradiated (electrons) oxide glasses

Nadège Ollier, François Farges, Bruno Boizot, Pierre Lombard, Anne Marie Flank, Pierre Lagarde

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Ti-doped borosilicate and disilicate glasses were irradiated with high-energetic electrons in order to study Ti(IV) reduction processes. Reduction efficiency was actually confirmed by an important Ti(III) EPR signal around g=1.93 in irradiated samples. The Ti(III) amount increases with the irradiation dose. Moreover, the Ti(III) environment depends on the glass composition. Hence, the reduction process efficiency is strongly correlated to the Ti(IV) environment in the pristine glass. The Ti environment was analyzed by Ti K-edge XANES in order to understand the reduction mechanisms. Pre-edge analysis of non-irradiated samples indicates the presence of four, five and six coordinated tetravalent Ti sites in borosilicate glasses, whereas in disilicate the Ti(IV) coordination is a mixture between five-fold and six-fold. In irradiated samples, the Ti pre-edge shows a slight low-energy shift associated to an intensity decrease in disilicate glasses. Correlation between EPR and XANES experiments allows for interpretation of the pre-edge variation in terms of Ti(III) formation. Profiles (μm resolution) were also performed to measure the proportion of Ti(III) on different points across the irradiated DS. No significant difference in XANES spectra was observed suggesting that the production of Ti(III) is homogeneous in the volume.

Original languageEnglish
Title of host publicationX-RAY ABSORPTION FINE STRUCTURE - XAFS13
Subtitle of host publication13th International Conference
Pages523-525
Number of pages3
DOIs
Publication statusPublished - 26 Mar 2007
Externally publishedYes
EventX-RAY ABSORPTION FINE STRUCTURE - XAFS13: 13th International Conference - Stanford, CA, United States
Duration: 9 Jul 200614 Jul 2006

Publication series

NameAIP Conference Proceedings
Volume882
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

ConferenceX-RAY ABSORPTION FINE STRUCTURE - XAFS13: 13th International Conference
Country/TerritoryUnited States
CityStanford, CA
Period9/07/0614/07/06

Keywords

  • Glasses
  • Irradiation
  • Reduction
  • Ti XANES

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