Abstract
We demonstrate the directional growth of Ge on a GaAs {100} wafer at 175 °C using radio-frequency plasma-enhanced chemical vapor deposition at 13.56 MHz under conditions where nanocrystals are the primary contributors to film growth. High resolution transmission electron microscopy (HRTEM) verifies the transport of plasma-formed nanocrystals to the substrate surface where they are initially mobile. Furthermore, cross-sectional HRTEM images show directional growth on the GaAs wafer, wherein the incident Ge nanocrystals have adopted the orientation of the underlying lattice.
| Original language | English |
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| Article number | 103108 |
| Journal | Applied Physics Letters |
| Volume | 92 |
| Issue number | 10 |
| DOIs | |
| Publication status | Published - 1 Jan 2008 |