Directional growth of Ge on GaAs at 175 °c using plasma-generated nanocrystals

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Abstract

We demonstrate the directional growth of Ge on a GaAs {100} wafer at 175 °C using radio-frequency plasma-enhanced chemical vapor deposition at 13.56 MHz under conditions where nanocrystals are the primary contributors to film growth. High resolution transmission electron microscopy (HRTEM) verifies the transport of plasma-formed nanocrystals to the substrate surface where they are initially mobile. Furthermore, cross-sectional HRTEM images show directional growth on the GaAs wafer, wherein the incident Ge nanocrystals have adopted the orientation of the underlying lattice.

Original languageEnglish
Article number103108
JournalApplied Physics Letters
Volume92
Issue number10
DOIs
Publication statusPublished - 1 Jan 2008

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