Dispersive processes of light-induced defect creation in hydrogenated amorphous silicon

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Abstract

The growing curve of light-induced dangling bonds under illumination has been observed for various intensities of illumination in a-Si:H. It is fitted to a stretched exponential function and then two parameters β and τ involved in the function are estimated as a function of saturated dangling bond density Nss. The experimental values of β, τ, and Nss are compared with those calculated based on our model of light-induced defect creation in a-Si:H.

Original languageEnglish
Pages (from-to)232-236
Number of pages5
JournalSolid State Communications
Volume142
Issue number4
DOIs
Publication statusPublished - 1 Apr 2007

Keywords

  • A. Amorphous Semiconductors
  • A. Disordered system
  • D. Light-induced phenomena
  • D. Recombination and trapping

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