Abstract
The growing curve of light-induced dangling bonds under illumination has been observed for various intensities of illumination in a-Si:H. It is fitted to a stretched exponential function and then two parameters β and τ involved in the function are estimated as a function of saturated dangling bond density Nss. The experimental values of β, τ, and Nss are compared with those calculated based on our model of light-induced defect creation in a-Si:H.
| Original language | English |
|---|---|
| Pages (from-to) | 232-236 |
| Number of pages | 5 |
| Journal | Solid State Communications |
| Volume | 142 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 1 Apr 2007 |
Keywords
- A. Amorphous Semiconductors
- A. Disordered system
- D. Light-induced phenomena
- D. Recombination and trapping
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